Loading…
Multiwavelength simultaneous monitoring by integrated planar lightwave circuit and fast Fourier transform techniques
We report a multiwavelength simultaneous monitoring method using the integrated planar lightwave circuit and fast Fourier transform techniques with a single detector. Accuracies of wavelength and power measurements are within /spl plusmn/ 3 GHz and /spl plusmn/ 0.5 dB, both in a 13-dB dynamic range...
Saved in:
Published in: | IEEE photonics technology letters 2003-12, Vol.15 (12), p.1752-1754 |
---|---|
Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3 |
---|---|
cites | cdi_FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3 |
container_end_page | 1754 |
container_issue | 12 |
container_start_page | 1752 |
container_title | IEEE photonics technology letters |
container_volume | 15 |
creator | Xiao Lin Li Yan Madabhushi, R. |
description | We report a multiwavelength simultaneous monitoring method using the integrated planar lightwave circuit and fast Fourier transform techniques with a single detector. Accuracies of wavelength and power measurements are within /spl plusmn/ 3 GHz and /spl plusmn/ 0.5 dB, both in a 13-dB dynamic range of optical power, respectively. |
doi_str_mv | 10.1109/LPT.2003.819752 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_LPT_2003_819752</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1253524</ieee_id><sourcerecordid>901709560</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3</originalsourceid><addsrcrecordid>eNp9kb1PwzAQxSMEEqUwM7BYDDC1teOPxCNCFJCKYCiz5SSX1lXiFNsB9b_HUZCQGJj8dPq9s969JLkkeE4IlovV23qeYkznOZEZT4-SCZGMzDDJ2HHUOGpCKD9NzrzfYUwYp2yShJe-CeZLf0IDdhO2yJs2TrSFrveo7awJnTN2g4oDMjbAxukAFdo32mqHGrPZhsGMSuPK3gSkbYVq7QNadr0z4FBw2vq6cy0KUG6t-ejBnycntW48XPy80-R9-bC-f5qtXh-f7-9Ws5IyGWYy5QwIYFrzUkLJZSoEyTjJixqKXBcii4pmnBEp4rQaYFnRIqNCYpFVdJrcjnv3rhv-Dao1voSmGeMpGY-DJRc4kjf_kmlOhZBcRvD6D7iLQW1MofKcpTSPh47QYoRK13nvoFZ7Z1rtDopgNZSlYllqKEuNZUXH1egwAPBLp5zylNFvpCOSAw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884238104</pqid></control><display><type>article</type><title>Multiwavelength simultaneous monitoring by integrated planar lightwave circuit and fast Fourier transform techniques</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Xiao Lin ; Li Yan ; Madabhushi, R.</creator><creatorcontrib>Xiao Lin ; Li Yan ; Madabhushi, R.</creatorcontrib><description>We report a multiwavelength simultaneous monitoring method using the integrated planar lightwave circuit and fast Fourier transform techniques with a single detector. Accuracies of wavelength and power measurements are within /spl plusmn/ 3 GHz and /spl plusmn/ 0.5 dB, both in a 13-dB dynamic range of optical power, respectively.</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/LPT.2003.819752</identifier><identifier>CODEN: IPTLEL</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuits ; Detectors ; Dynamic range ; Fast Fourier transforms ; Fourier transforms ; Frequency ; Monitoring ; Noise levels ; Optical filters ; Photonics ; Power measurement ; Power measurements ; Programmable control ; Wavelength division multiplexing ; Wavelength measurement ; Wavelengths</subject><ispartof>IEEE photonics technology letters, 2003-12, Vol.15 (12), p.1752-1754</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2003</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3</citedby><cites>FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1253524$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Xiao Lin</creatorcontrib><creatorcontrib>Li Yan</creatorcontrib><creatorcontrib>Madabhushi, R.</creatorcontrib><title>Multiwavelength simultaneous monitoring by integrated planar lightwave circuit and fast Fourier transform techniques</title><title>IEEE photonics technology letters</title><addtitle>LPT</addtitle><description>We report a multiwavelength simultaneous monitoring method using the integrated planar lightwave circuit and fast Fourier transform techniques with a single detector. Accuracies of wavelength and power measurements are within /spl plusmn/ 3 GHz and /spl plusmn/ 0.5 dB, both in a 13-dB dynamic range of optical power, respectively.</description><subject>Circuits</subject><subject>Detectors</subject><subject>Dynamic range</subject><subject>Fast Fourier transforms</subject><subject>Fourier transforms</subject><subject>Frequency</subject><subject>Monitoring</subject><subject>Noise levels</subject><subject>Optical filters</subject><subject>Photonics</subject><subject>Power measurement</subject><subject>Power measurements</subject><subject>Programmable control</subject><subject>Wavelength division multiplexing</subject><subject>Wavelength measurement</subject><subject>Wavelengths</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNp9kb1PwzAQxSMEEqUwM7BYDDC1teOPxCNCFJCKYCiz5SSX1lXiFNsB9b_HUZCQGJj8dPq9s969JLkkeE4IlovV23qeYkznOZEZT4-SCZGMzDDJ2HHUOGpCKD9NzrzfYUwYp2yShJe-CeZLf0IDdhO2yJs2TrSFrveo7awJnTN2g4oDMjbAxukAFdo32mqHGrPZhsGMSuPK3gSkbYVq7QNadr0z4FBw2vq6cy0KUG6t-ejBnycntW48XPy80-R9-bC-f5qtXh-f7-9Ws5IyGWYy5QwIYFrzUkLJZSoEyTjJixqKXBcii4pmnBEp4rQaYFnRIqNCYpFVdJrcjnv3rhv-Dao1voSmGeMpGY-DJRc4kjf_kmlOhZBcRvD6D7iLQW1MofKcpTSPh47QYoRK13nvoFZ7Z1rtDopgNZSlYllqKEuNZUXH1egwAPBLp5zylNFvpCOSAw</recordid><startdate>20031201</startdate><enddate>20031201</enddate><creator>Xiao Lin</creator><creator>Li Yan</creator><creator>Madabhushi, R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20031201</creationdate><title>Multiwavelength simultaneous monitoring by integrated planar lightwave circuit and fast Fourier transform techniques</title><author>Xiao Lin ; Li Yan ; Madabhushi, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Circuits</topic><topic>Detectors</topic><topic>Dynamic range</topic><topic>Fast Fourier transforms</topic><topic>Fourier transforms</topic><topic>Frequency</topic><topic>Monitoring</topic><topic>Noise levels</topic><topic>Optical filters</topic><topic>Photonics</topic><topic>Power measurement</topic><topic>Power measurements</topic><topic>Programmable control</topic><topic>Wavelength division multiplexing</topic><topic>Wavelength measurement</topic><topic>Wavelengths</topic><toplevel>online_resources</toplevel><creatorcontrib>Xiao Lin</creatorcontrib><creatorcontrib>Li Yan</creatorcontrib><creatorcontrib>Madabhushi, R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) Online</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE photonics technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xiao Lin</au><au>Li Yan</au><au>Madabhushi, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Multiwavelength simultaneous monitoring by integrated planar lightwave circuit and fast Fourier transform techniques</atitle><jtitle>IEEE photonics technology letters</jtitle><stitle>LPT</stitle><date>2003-12-01</date><risdate>2003</risdate><volume>15</volume><issue>12</issue><spage>1752</spage><epage>1754</epage><pages>1752-1754</pages><issn>1041-1135</issn><eissn>1941-0174</eissn><coden>IPTLEL</coden><abstract>We report a multiwavelength simultaneous monitoring method using the integrated planar lightwave circuit and fast Fourier transform techniques with a single detector. Accuracies of wavelength and power measurements are within /spl plusmn/ 3 GHz and /spl plusmn/ 0.5 dB, both in a 13-dB dynamic range of optical power, respectively.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LPT.2003.819752</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1041-1135 |
ispartof | IEEE photonics technology letters, 2003-12, Vol.15 (12), p.1752-1754 |
issn | 1041-1135 1941-0174 |
language | eng |
recordid | cdi_crossref_primary_10_1109_LPT_2003_819752 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Circuits Detectors Dynamic range Fast Fourier transforms Fourier transforms Frequency Monitoring Noise levels Optical filters Photonics Power measurement Power measurements Programmable control Wavelength division multiplexing Wavelength measurement Wavelengths |
title | Multiwavelength simultaneous monitoring by integrated planar lightwave circuit and fast Fourier transform techniques |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T18%3A07%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Multiwavelength%20simultaneous%20monitoring%20by%20integrated%20planar%20lightwave%20circuit%20and%20fast%20Fourier%20transform%20techniques&rft.jtitle=IEEE%20photonics%20technology%20letters&rft.au=Xiao%20Lin&rft.date=2003-12-01&rft.volume=15&rft.issue=12&rft.spage=1752&rft.epage=1754&rft.pages=1752-1754&rft.issn=1041-1135&rft.eissn=1941-0174&rft.coden=IPTLEL&rft_id=info:doi/10.1109/LPT.2003.819752&rft_dat=%3Cproquest_cross%3E901709560%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c349t-9254e1e03f5c9ec5926617518bfeb8ab678bf3754196518d4e1e9d3b7369067d3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=884238104&rft_id=info:pmid/&rft_ieee_id=1253524&rfr_iscdi=true |