VCSEL Intrinsic Response Extraction Using T-Matrix Formalism

We present a new method to remove the parasitics contribution to the vertical-cavity surface-emitting laser (VCSEL) chip response, in order to obtain the intrinsic S 21 behavior. We demonstrate that the chip can be split into two cascaded subsystems representing the electrical access and the optical...

Full description

Saved in:
Bibliographic Details
Published in:IEEE photonics technology letters 2009-07, Vol.21 (14), p.957-959
Main Authors: Bacou, A., Hayat, A., Rissons, A., Iakovlev, V., Syrbu, A., Mollier, J.-C., Kapon, E.
Format: Article
Language:English
Subjects:
Bandwidth
Chips
Electric circuits
Electric variables measurement
Electrical equivalent circuit
Equivalence
Equivalent circuits
Extraction
Formalism
Holes
long-wavelength vertical-cavity surface-emitting laser (VCSEL)
Optical feedback
Probes
Quantum cascade lasers
S-parameters
Semiconductor device measurement
Surface emitting lasers
transfer function matrix
Transfer functions
Vertical cavity surface emission lasers
Vertical cavity surface emitting lasers
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present a new method to remove the parasitics contribution to the vertical-cavity surface-emitting laser (VCSEL) chip response, in order to obtain the intrinsic S 21 behavior. We demonstrate that the chip can be split into two cascaded subsystems representing the electrical access and the optical cavity, respectively. An equivalent electrical circuit defining the behavior of the electrical access is combined with T -matrix formalism to remove the parasitics contribution from the measured S 21 response. Results allow us to determine the intrinsic 3-dB bandwidth of the VCSEL.
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2009.2020805