Knowledge Acquisition for ATE Diagnosis

An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize i...

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Bibliographic Details
Published in:IEEE aerospace and electronic systems magazine 1986-07, Vol.1 (7), p.5-12
Main Authors: Ryan, Patricia M., Wilkinson, A. Jesse
Format: Magazinearticle
Language:English
Subjects:
Artificial intelligence
Circuit faults
Circuit testing
Fault diagnosis
Hardware
Humans
Knowledge acquisition
System testing
Very large scale integration
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Summary:An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize it, and the final form of the knowledge representations which resulted from our work are discussed in this paper.
ISSN:0885-8985
1557-959X
DOI:10.1109/MAES.1986.5005153