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Beyond Wires: The Future of Interconnects
This issue introduces a selection of outstanding papers originally presented at Hot Interconnects (HotI-30) in 2023 and features an article from Meta Reality Labs exploring the use of compute-in-memory for AR/VR applications.
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Published in: | IEEE MICRO 2024-03, Vol.44 (2), p.4-5 |
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container_issue | 2 |
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container_title | IEEE MICRO |
container_volume | 44 |
creator | Lee, Hsien-Hsin S. |
description | This issue introduces a selection of outstanding papers originally presented at Hot Interconnects (HotI-30) in 2023 and features an article from Meta Reality Labs exploring the use of compute-in-memory for AR/VR applications. |
doi_str_mv | 10.1109/MM.2024.3373336 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_MM_2024_3373336</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10492683</ieee_id><sourcerecordid>3033620747</sourcerecordid><originalsourceid>FETCH-LOGICAL-c285t-84a7e01eddb268a6abd0b98b883330da4b91c47cb825b1d1fd012e69ae20c67b3</originalsourceid><addsrcrecordid>eNpNkD1PwzAQhi0EEqEwszBEYmJIe_5I7LBBRaFSI5YiRssfF5EKkmInQ_89qdKB6ZbnvXvvIeSWwpxSKBdVNWfAxJxzyTkvzkhCSy4zQQU_JwkwyTIqObskVzHuACBnoBLy8IyHrvXpZxMwPqbbL0xXQz8ETLs6Xbc9Bte1Lbo-XpOL2nxHvDnNGflYvWyXb9nm_XW9fNpkjqm8z5QwEoGi95YVyhTGerClskqNrcAbYUvqhHRWsdxST2sPlGFRGmTgCmn5jNxPe_eh-x0w9nrXDaEdT2oO42MMpJAjtZgoF7oYA9Z6H5ofEw6agj760FWljz70yceYuJsSDSL-o0U59uT8D8WbWeM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3033620747</pqid></control><display><type>article</type><title>Beyond Wires: The Future of Interconnects</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Lee, Hsien-Hsin S.</creator><creatorcontrib>Lee, Hsien-Hsin S.</creatorcontrib><description>This issue introduces a selection of outstanding papers originally presented at Hot Interconnects (HotI-30) in 2023 and features an article from Meta Reality Labs exploring the use of compute-in-memory for AR/VR applications.</description><identifier>ISSN: 0272-1732</identifier><identifier>EISSN: 1937-4143</identifier><identifier>DOI: 10.1109/MM.2024.3373336</identifier><identifier>CODEN: IEMIDZ</identifier><language>eng</language><publisher>Los Alamitos: IEEE</publisher><subject>Interconnections</subject><ispartof>IEEE MICRO, 2024-03, Vol.44 (2), p.4-5</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2024</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0002-8926-8243</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10492683$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27923,27924,54795</link.rule.ids></links><search><creatorcontrib>Lee, Hsien-Hsin S.</creatorcontrib><title>Beyond Wires: The Future of Interconnects</title><title>IEEE MICRO</title><addtitle>MM</addtitle><description>This issue introduces a selection of outstanding papers originally presented at Hot Interconnects (HotI-30) in 2023 and features an article from Meta Reality Labs exploring the use of compute-in-memory for AR/VR applications.</description><subject>Interconnections</subject><issn>0272-1732</issn><issn>1937-4143</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNpNkD1PwzAQhi0EEqEwszBEYmJIe_5I7LBBRaFSI5YiRssfF5EKkmInQ_89qdKB6ZbnvXvvIeSWwpxSKBdVNWfAxJxzyTkvzkhCSy4zQQU_JwkwyTIqObskVzHuACBnoBLy8IyHrvXpZxMwPqbbL0xXQz8ETLs6Xbc9Bte1Lbo-XpOL2nxHvDnNGflYvWyXb9nm_XW9fNpkjqm8z5QwEoGi95YVyhTGerClskqNrcAbYUvqhHRWsdxST2sPlGFRGmTgCmn5jNxPe_eh-x0w9nrXDaEdT2oO42MMpJAjtZgoF7oYA9Z6H5ofEw6agj760FWljz70yceYuJsSDSL-o0U59uT8D8WbWeM</recordid><startdate>20240301</startdate><enddate>20240301</enddate><creator>Lee, Hsien-Hsin S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><orcidid>https://orcid.org/0000-0002-8926-8243</orcidid></search><sort><creationdate>20240301</creationdate><title>Beyond Wires: The Future of Interconnects</title><author>Lee, Hsien-Hsin S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c285t-84a7e01eddb268a6abd0b98b883330da4b91c47cb825b1d1fd012e69ae20c67b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Interconnections</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Hsien-Hsin S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE MICRO</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Hsien-Hsin S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Beyond Wires: The Future of Interconnects</atitle><jtitle>IEEE MICRO</jtitle><stitle>MM</stitle><date>2024-03-01</date><risdate>2024</risdate><volume>44</volume><issue>2</issue><spage>4</spage><epage>5</epage><pages>4-5</pages><issn>0272-1732</issn><eissn>1937-4143</eissn><coden>IEMIDZ</coden><abstract>This issue introduces a selection of outstanding papers originally presented at Hot Interconnects (HotI-30) in 2023 and features an article from Meta Reality Labs exploring the use of compute-in-memory for AR/VR applications.</abstract><cop>Los Alamitos</cop><pub>IEEE</pub><doi>10.1109/MM.2024.3373336</doi><tpages>2</tpages><orcidid>https://orcid.org/0000-0002-8926-8243</orcidid><oa>free_for_read</oa></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Journals |
subjects | Interconnections |
title | Beyond Wires: The Future of Interconnects |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T00%3A13%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Beyond%20Wires:%20The%20Future%20of%20Interconnects&rft.jtitle=IEEE%20MICRO&rft.au=Lee,%20Hsien-Hsin%20S.&rft.date=2024-03-01&rft.volume=44&rft.issue=2&rft.spage=4&rft.epage=5&rft.pages=4-5&rft.issn=0272-1732&rft.eissn=1937-4143&rft.coden=IEMIDZ&rft_id=info:doi/10.1109/MM.2024.3373336&rft_dat=%3Cproquest_cross%3E3033620747%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c285t-84a7e01eddb268a6abd0b98b883330da4b91c47cb825b1d1fd012e69ae20c67b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=3033620747&rft_id=info:pmid/&rft_ieee_id=10492683&rfr_iscdi=true |