Measurement of negative resistance of tunnel diodes

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Bibliographic Details
Published in:Proceedings of the IEEE 1965-01, Vol.53 (5), p.484-485
Main Author: Lyons, J.B.
Format: Article
Language:English
Subjects:
Circuits
Diodes
Electric breakdown
Electrical resistance measurement
Electrons
Frequency
Load flow
Noise reduction
Random processes
Writing
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ISSN:0018-9219
DOI:10.1109/PROC.1965.3821