Thermal noise behavior of a thick depletion region avalanche photodetector

An avalanche photodetector useful at both the 0.9 and 1.06 micron wavelengths is described. The detector performance is characterized to show its usefulness at elevated temperatures.

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Bibliographic Details
Published in:Proceedings of the IEEE 1968-01, Vol.56 (7), p.1222-1223
Main Authors: Klippel, F.P., Huth, G.C.
Format: Article
Language:English
Subjects:
Breakdown voltage
Charge carrier density
P-n junctions
Photodetectors
Schottky diodes
Signal detection
Silicon
Solids
Testing
Thermal stresses
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Description
Summary:An avalanche photodetector useful at both the 0.9 and 1.06 micron wavelengths is described. The detector performance is characterized to show its usefulness at elevated temperatures.
ISSN:0018-9219
DOI:10.1109/PROC.1968.6528