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X-band silicon double-drift IMPATT diodes using multiple epitaxy
Silicon double-drift IMPATT diodes made by consecutive epitaxial deposition have been fabricated successfully. Output power in excess of 1.7 W with 10-percent efficiency was obtained at X band.
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Published in: | Proceedings of the IEEE 1972-01, Vol.60 (9), p.1104-1105 |
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container_end_page | 1105 |
container_issue | 9 |
container_start_page | 1104 |
container_title | Proceedings of the IEEE |
container_volume | 60 |
creator | Ying, R.S. |
description | Silicon double-drift IMPATT diodes made by consecutive epitaxial deposition have been fabricated successfully. Output power in excess of 1.7 W with 10-percent efficiency was obtained at X band. |
doi_str_mv | 10.1109/PROC.1972.8861 |
format | article |
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Output power in excess of 1.7 W with 10-percent efficiency was obtained at X band.</description><subject>Boron</subject><subject>Charge carrier processes</subject><subject>Epitaxial growth</subject><subject>Epitaxial layers</subject><subject>Frequency</subject><subject>Impedance</subject><subject>Ion implantation</subject><subject>Semiconductor diodes</subject><subject>Silicon</subject><subject>Substrates</subject><issn>0018-9219</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1972</creationdate><recordtype>article</recordtype><recordid>eNpFj01LxDAYhHNQcF29evGSP5Caj6ZNbi7Fj4WVXaSCt5A2byTSbUvTgvvvbVnB0zAwM8yD0B2jCWNUPxze90XCdM4TpTJ2gVaUMkU0Z_oKXcf4TSkVMhMr9PhJKts6HEMT6q7FrpuqBogbgh_x9u2wKUvsQucg4imG9gsfp2YMfQMY-jDan9MNuvS2iXD7p2v08fxUFq9kt3_ZFpsdqZnSI0krL6itqdRMAOPKgxQZl8qLavaWu0p6m_lc2hy8dcIJzX3tuYe8hpymYo2S8249dDEO4E0_hKMdToZRszCbhdkszGZhngv350IAgP9wKmk-f_gFVndVUA</recordid><startdate>19720101</startdate><enddate>19720101</enddate><creator>Ying, R.S.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19720101</creationdate><title>X-band silicon double-drift IMPATT diodes using multiple epitaxy</title><author>Ying, R.S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c189t-4bf30ac05913e128fe536258f3b3e1a2db5fa6f75a7efad3d392fcf2fe7ce7043</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1972</creationdate><topic>Boron</topic><topic>Charge carrier processes</topic><topic>Epitaxial growth</topic><topic>Epitaxial layers</topic><topic>Frequency</topic><topic>Impedance</topic><topic>Ion implantation</topic><topic>Semiconductor diodes</topic><topic>Silicon</topic><topic>Substrates</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ying, R.S.</creatorcontrib><collection>CrossRef</collection><jtitle>Proceedings of the IEEE</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ying, R.S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-band silicon double-drift IMPATT diodes using multiple epitaxy</atitle><jtitle>Proceedings of the IEEE</jtitle><stitle>JPROC</stitle><date>1972-01-01</date><risdate>1972</risdate><volume>60</volume><issue>9</issue><spage>1104</spage><epage>1105</epage><pages>1104-1105</pages><issn>0018-9219</issn><coden>IEEPAD</coden><abstract>Silicon double-drift IMPATT diodes made by consecutive epitaxial deposition have been fabricated successfully. Output power in excess of 1.7 W with 10-percent efficiency was obtained at X band.</abstract><pub>IEEE</pub><doi>10.1109/PROC.1972.8861</doi><tpages>2</tpages></addata></record> |
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identifier | ISSN: 0018-9219 |
ispartof | Proceedings of the IEEE, 1972-01, Vol.60 (9), p.1104-1105 |
issn | 0018-9219 |
language | eng |
recordid | cdi_crossref_primary_10_1109_PROC_1972_8861 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Boron Charge carrier processes Epitaxial growth Epitaxial layers Frequency Impedance Ion implantation Semiconductor diodes Silicon Substrates |
title | X-band silicon double-drift IMPATT diodes using multiple epitaxy |
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