Extraction of /spl epsiv//sub r/(f) and tan/spl delta/(f) for printed circuit board insulators up to 30 GHz using the short-pulse propagation technique

• Published in: IEEE transactions on advanced packaging 2005-02, Vol.28 (1), p.4-12
• Main Authors: Deutsch, A., Winkel, T.-M., Kopcsay, G.V., Surovic, C.W., Rubin, B.J., Katopis, G.A., Chamberlin, B.J., Krabbenhoft, R.S.
• Format: Article
• Language: English
• Subjects: Dielectric constant; Dielectric loss extraction; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency; lossy causal transmission-line models; Measurement techniques; Performance evaluation; printed circuit board characterization; Propagation losses; Pulse measurements; short-pulse propagation measurement technique; Wiring
• ISSN: 1521-3323; 1557-9980
• DOI: 10.1109/TADVP.2004.841679

In this paper, the self-consistent, frequency-dependent dielectric constant epsiv r (f) and dielectric loss tandelta(f) of several materials are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. The simple measurement technique is performed in the time domain on representative printed circuit board wiring. Broadband, fully causal transmission-line models based on these results are generated up to 50 GHz for card wiring using low loss materials including BT, Nelco N4000-13, and Nelco N4000-13SI. Simulation and modeling results highlight the need for the accurate frequency-dependent dielectric loss extraction. Signal propagation based on these results shows very good agreement with measured step and pulse time-domain excitations and provides validation of the measurement and model generation technique