MOCVD and MOD of YBCO and Buffer Layers on Textured Metal Tapes

Different layer architectures produced by only MOD, only MOCVD and combinations of MOD buffers and MOCVD YBCO are presented. RTR MOCVD-YBCO layers obtained on MOD-CeO 2 /MOD-LZO/Ni5 at%W tapes demonstrate critical current densities up to 2 MA/cm 2 at 77 K. On single LZO (50-100 nm) buffered Ni5 at%W...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2009-06, Vol.19 (3), p.3160-3163
Main Authors: Stadel, O., Muydinov, R.Yu, Brauer, G., Rikel, M.O., Ehrenberg, J., Bock, J., Kotzyba, G., Nast, R., Goldacker, W., Samoylenkov, S.V., Kaul, A.R.
Format: Article
Language:English
Subjects:
ANNEALING PROCESSES
Buffer layers
Buffers
Chemical vapor deposition
Coated conductor
Conductors
COPPER OXIDE
Critical current density
CURRENT DENSITY
Delaminating
DENSITY
DEPOSITION
Inductors
MOCVD
MOD
Production
RABiTS
Substrates
Superconducting tapes
SUPERCONDUCTIVITY
SUPERCONDUCTORS
TAPE
YBCO superconductors
Yttrium barium copper oxide
YTTRIUM OXIDE
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Summary:Different layer architectures produced by only MOD, only MOCVD and combinations of MOD buffers and MOCVD YBCO are presented. RTR MOCVD-YBCO layers obtained on MOD-CeO 2 /MOD-LZO/Ni5 at%W tapes demonstrate critical current densities up to 2 MA/cm 2 at 77 K. On single LZO (50-100 nm) buffered Ni5 at%W tapes from Nexans Superconductors and on RTR MOCVD buffer layers critical current densities between 0.8 and 1.3 MA/cm are obtained. RTR MOD-LZO layers often show delamination during YBCO deposition. Preannealing treatment before YBCO deposition allows to avoid this. Tapes up to 10 m are produced by combination of MOD-LZO and RTR MOCVD-YBCO.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2009.2018736