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Study of Heat Localization in HTS Wires at Overload Conditions
A common problem of superconducting devices is to survive during a fault with a current overload. At a fault, superconducting device will have strong overheating and burning out is possible. The problem becomes more serious in case if a high-temperature superconducting (HTS) wire has a weak point wh...
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Published in: | IEEE transactions on applied superconductivity 2017-06, Vol.27 (4), p.1-5 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A common problem of superconducting devices is to survive during a fault with a current overload. At a fault, superconducting device will have strong overheating and burning out is possible. The problem becomes more serious in case if a high-temperature superconducting (HTS) wire has a weak point where the critical current is less than the average over a wire. Such a weak point could be the point of origination of strong overheating within a very localized area. This can lead to burning and destroying of an HTS device. To study this problem, we developed the experimental setup with the spatial resolution 2 mm and the time resolution 1 ms to observe a local temperature/voltage evolution in HTS tapes overloaded by currents. The preliminary experiments were performed to measure local heat/voltage development on 2G HTS tapes with an artificial weak point. Local heat/voltage evolutions have been measured and compared with calculations by our model developed earlier. |
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ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/TASC.2016.2646178 |