Failure Analysis of YBCO Tapes Considering the Amplitude and Duration of Sinusoidal Overcurrent

The ultimate current-carrying capacity of high-temperature superconducting (HTS) tapes is extremely important for the design of superconducting devices, especially for superconducting fault current limiter and HTS cables which may be subject to short-circuit overcurrent. In this paper, an HTS tape l...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2019-08, Vol.29 (5), p.1-5
Main Authors: Chen, Guilun, Ren, Li, Xu, Ying, Yan, Sinian, Liang, Siyuan, Pu, Dongsheng, Wang, Wei, Hu, Ziheng, Zhang, Bin, Li, Jingdong, Shi, Jing, Tang, Yuejin
Format: Article
Language:English
Subjects:
Alternating current
Amplitudes
Cables
Carrying capacity
Circuits
Current limiters
Current measurement
Electronic devices
Failure analysis
failure characteristic
High temperature
Integrated circuits
Overcurrent
Resistance
Short circuits
sinusoidal overcurrent
Superconducting cables
Superconducting devices
Superconducting films
Superconducting tapes
Superconductivity
threshold parameter
YBCO
YBCO superconductors
Yttrium barium copper oxide
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Summary:The ultimate current-carrying capacity of high-temperature superconducting (HTS) tapes is extremely important for the design of superconducting devices, especially for superconducting fault current limiter and HTS cables which may be subject to short-circuit overcurrent. In this paper, an HTS tape life characteristics test platform was built, and experiments were carried out on the YBCO tape to study its ultimate current-carrying characteristic under 50 Hz ac current. AC overcurrent amplitude and duration are used as experimental variables. According to the single variable method, the current and voltage of the YBCO tapes under different types of overcurrent were measured. After analyzing and generalizing the test results, the thresholds of its bearable current and corresponding duration are discussed. This paper provides data support and reference for the reliable design of these HTS power devices.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2019.2897374