A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs

This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can eff...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2014-12, Vol.33 (12), p.2020-2024
Main Authors: Hou, Chih-Sheng, Li, Jin-Fu, Fu, Ting-Jun
Format: Article
Language:English
Subjects:
Built-in self-test
Circuit faults
Compressed
compression
Data compression
Design engineering
diagnosis
Diagnostic systems
Dynamical systems
Dynamics
March test
Rams
Random access memory
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Summary:This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K×16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K×16-bit RAM using TSMC 0.18 um cell library.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2014.2363393