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Advanced Mechanical/Optical Configuration of Real-Time Moiré Interferometry for Thermal Deformation Analysis of Fan-Out Wafer Level Package
The mechanical/optical configuration of moiré interferometry for real-time observation of thermal deformations is advanced to quantify the thermomechanical behavior of fan-out wafer level packages (FO-WLPs). Two most notable advancements are on the: 1) mechanical front: conduction-based thermal cha...
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Published in: | IEEE transactions on components, packaging, and manufacturing technology (2011) packaging, and manufacturing technology (2011), 2018-05, Vol.8 (5), p.764-772 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The mechanical/optical configuration of moiré interferometry for real-time observation of thermal deformations is advanced to quantify the thermomechanical behavior of fan-out wafer level packages (FO-WLPs). Two most notable advancements are on the: 1) mechanical front: conduction-based thermal chamber for a wide range of ramp rates with accurate temperature control, and 2) optical front: microscope objectives to observe a microscopic field of view. The advancements enable the method to document the global and local behavior of an FO-WLP while it is subjected to a controlled thermal excursion. After describing the details of two advancements, a procedure of actual testing is presented. The advanced configuration is implemented to analyze an FO-WLP in a package-on-package with and without a reworkable underfill. The results obtained from the global and local analyses are presented, and reliability implications are discussed. |
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ISSN: | 2156-3950 2156-3985 |
DOI: | 10.1109/TCPMT.2018.2805873 |