Dependence of charge accumulation on sample thickness in Nano-SiO 2 doped IDPE

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Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation 2013-02, Vol.20 (1), p.337-345
Main Authors: Zepeng Lv, Xia Wang, Kai Wu, Xi Chen, Yonghong Cheng, Dissado, L. A.
Format: Article
Language:English
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ISSN:1070-9878
DOI:10.1109/TDEI.2013.6451375