In-process functional testing of pixel circuit in AM-OLEDs

This paper presents a functional testing scheme using a two-thin-film-transistor (TFT) pixel circuit of an active-matrix organic light-emitting display (AM-OLED). This pixel circuit and the co-operative electrical testing scheme can not only evaluate the characteristics of each TFT, but also determi...

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Bibliographic Details
Published in:IEEE transactions on electron devices 2005-10, Vol.52 (10), p.2157-2162
Main Authors: Yen-Chung Lin, Shieh, H.-P.D.
Format: Article
Language:English
Subjects:
Active-matrix (AM)
active-matrix organic light-emitting display (AM-OLED)
Applied sciences
Arrays
Circuits
Defects
Displays
Electronics
Exact sciences and technology
Functional testing
light-emitting diode (LED)
Manufacturing testing
Optoelectronic devices
organic light-emitting display (OLED)
pixel
Pixels
Repairing
Semiconductor devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
testing
Thin film transistors
thin-film transistor (TFT)
Transistors
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Summary:This paper presents a functional testing scheme using a two-thin-film-transistor (TFT) pixel circuit of an active-matrix organic light-emitting display (AM-OLED). This pixel circuit and the co-operative electrical testing scheme can not only evaluate the characteristics of each TFT, but also determine the location of line and point defects in the TFT array. Information on defects can be used in a unique repair system that cutting and repairing these defects. Furthermore, the functional testing scheme can be applied as a part of yield management of the AM-OLED array process.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2005.856173