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Multilayered Barium Titanate Thin Films by Sol-Gel Method for Nonvolatile Memory Application
The modification of multispin casting multilayered barium titanate (BTO) thin films on indium tin oxide (ITO)/glass substrate without doping other elements is adopted to improve the memory performance. The X-ray photoelectron spectroscopy analysis reveals the concentration of oxygen vacancies can be...
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Published in: | IEEE transactions on electron devices 2014-12, Vol.61 (12), p.4090-4097 |
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container_title | IEEE transactions on electron devices |
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creator | Chang, Yu-Chi Xue, Ren-Yang Wang, Yeong-Her |
description | The modification of multispin casting multilayered barium titanate (BTO) thin films on indium tin oxide (ITO)/glass substrate without doping other elements is adopted to improve the memory performance. The X-ray photoelectron spectroscopy analysis reveals the concentration of oxygen vacancies can be reduced by the increasing number of the BTO layer. Mechanisms of conducting paths relating to the concentration of oxygen vacancies will also be explicated. The memory devices showed typical bipolar resistive switching behavior and an ON/OFF ratio of over 10 6 . The memory devices also exhibited outstanding uniformity. A retention time of over 10 5 s without fluctuation at room temperature and 85 °C can be achieved. |
doi_str_mv | 10.1109/TED.2014.2363651 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TED_2014_2363651</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6949144</ieee_id><sourcerecordid>3531105001</sourcerecordid><originalsourceid>FETCH-LOGICAL-c361t-ac653a65c5d8a30e9033016ad9cec9992155d98605e36f0add82bb9c9780dd493</originalsourceid><addsrcrecordid>eNo9kMFLwzAUxoMoOKd3wUvAc2fSpGlznHObwqYH600IWZKyjLSpaSv0vzdjw9PjPb7ve-_9ALjHaIYx4k_l8mWWIkxnKWGEZfgCTHCW5QlnlF2CCUK4SDgpyDW46bpDbBml6QR8bwfXWydHE4yGzzLYoYal7WUjewPLvW3gyrq6g7sRfnqXrI2DW9PvvYaVD_DdN7_eyZhg4rj2YYTztnVWxZFvbsFVJV1n7s51Cr5Wy3Lxmmw-1m-L-SZRhOE-kYplRLJMZbqQBBmOCIn3Sc2VUZzzND6iecFQZgirkNS6SHc7rnheIK0pJ1PweMptg_8ZTNeLgx9CE1cKzEheMJpHKFOATioVfNcFU4k22FqGUWAkjgxFZCiODMWZYbQ8nCzWGPMvZ5xyTCn5A7mdbMQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1637864736</pqid></control><display><type>article</type><title>Multilayered Barium Titanate Thin Films by Sol-Gel Method for Nonvolatile Memory Application</title><source>IEEE Xplore (Online service)</source><creator>Chang, Yu-Chi ; Xue, Ren-Yang ; Wang, Yeong-Her</creator><creatorcontrib>Chang, Yu-Chi ; Xue, Ren-Yang ; Wang, Yeong-Her</creatorcontrib><description>The modification of multispin casting multilayered barium titanate (BTO) thin films on indium tin oxide (ITO)/glass substrate without doping other elements is adopted to improve the memory performance. The X-ray photoelectron spectroscopy analysis reveals the concentration of oxygen vacancies can be reduced by the increasing number of the BTO layer. Mechanisms of conducting paths relating to the concentration of oxygen vacancies will also be explicated. The memory devices showed typical bipolar resistive switching behavior and an ON/OFF ratio of over 10 6 . The memory devices also exhibited outstanding uniformity. A retention time of over 10 5 s without fluctuation at room temperature and 85 °C can be achieved.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2014.2363651</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Barium titanate (BTO) ; Electrodes ; Indium tin oxide ; memory ; multilayer ; resistive random access memory (RRAM) ; sol-gel ; Substrates ; Surface morphology ; Surface treatment ; Temperature measurement</subject><ispartof>IEEE transactions on electron devices, 2014-12, Vol.61 (12), p.4090-4097</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Dec 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-ac653a65c5d8a30e9033016ad9cec9992155d98605e36f0add82bb9c9780dd493</citedby><cites>FETCH-LOGICAL-c361t-ac653a65c5d8a30e9033016ad9cec9992155d98605e36f0add82bb9c9780dd493</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6949144$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Chang, Yu-Chi</creatorcontrib><creatorcontrib>Xue, Ren-Yang</creatorcontrib><creatorcontrib>Wang, Yeong-Her</creatorcontrib><title>Multilayered Barium Titanate Thin Films by Sol-Gel Method for Nonvolatile Memory Application</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>The modification of multispin casting multilayered barium titanate (BTO) thin films on indium tin oxide (ITO)/glass substrate without doping other elements is adopted to improve the memory performance. The X-ray photoelectron spectroscopy analysis reveals the concentration of oxygen vacancies can be reduced by the increasing number of the BTO layer. Mechanisms of conducting paths relating to the concentration of oxygen vacancies will also be explicated. The memory devices showed typical bipolar resistive switching behavior and an ON/OFF ratio of over 10 6 . The memory devices also exhibited outstanding uniformity. A retention time of over 10 5 s without fluctuation at room temperature and 85 °C can be achieved.</description><subject>Barium titanate (BTO)</subject><subject>Electrodes</subject><subject>Indium tin oxide</subject><subject>memory</subject><subject>multilayer</subject><subject>resistive random access memory (RRAM)</subject><subject>sol-gel</subject><subject>Substrates</subject><subject>Surface morphology</subject><subject>Surface treatment</subject><subject>Temperature measurement</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNo9kMFLwzAUxoMoOKd3wUvAc2fSpGlznHObwqYH600IWZKyjLSpaSv0vzdjw9PjPb7ve-_9ALjHaIYx4k_l8mWWIkxnKWGEZfgCTHCW5QlnlF2CCUK4SDgpyDW46bpDbBml6QR8bwfXWydHE4yGzzLYoYal7WUjewPLvW3gyrq6g7sRfnqXrI2DW9PvvYaVD_DdN7_eyZhg4rj2YYTztnVWxZFvbsFVJV1n7s51Cr5Wy3Lxmmw-1m-L-SZRhOE-kYplRLJMZbqQBBmOCIn3Sc2VUZzzND6iecFQZgirkNS6SHc7rnheIK0pJ1PweMptg_8ZTNeLgx9CE1cKzEheMJpHKFOATioVfNcFU4k22FqGUWAkjgxFZCiODMWZYbQ8nCzWGPMvZ5xyTCn5A7mdbMQ</recordid><startdate>20141201</startdate><enddate>20141201</enddate><creator>Chang, Yu-Chi</creator><creator>Xue, Ren-Yang</creator><creator>Wang, Yeong-Her</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20141201</creationdate><title>Multilayered Barium Titanate Thin Films by Sol-Gel Method for Nonvolatile Memory Application</title><author>Chang, Yu-Chi ; Xue, Ren-Yang ; Wang, Yeong-Her</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-ac653a65c5d8a30e9033016ad9cec9992155d98605e36f0add82bb9c9780dd493</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Barium titanate (BTO)</topic><topic>Electrodes</topic><topic>Indium tin oxide</topic><topic>memory</topic><topic>multilayer</topic><topic>resistive random access memory (RRAM)</topic><topic>sol-gel</topic><topic>Substrates</topic><topic>Surface morphology</topic><topic>Surface treatment</topic><topic>Temperature measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chang, Yu-Chi</creatorcontrib><creatorcontrib>Xue, Ren-Yang</creatorcontrib><creatorcontrib>Wang, Yeong-Her</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chang, Yu-Chi</au><au>Xue, Ren-Yang</au><au>Wang, Yeong-Her</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Multilayered Barium Titanate Thin Films by Sol-Gel Method for Nonvolatile Memory Application</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2014-12-01</date><risdate>2014</risdate><volume>61</volume><issue>12</issue><spage>4090</spage><epage>4097</epage><pages>4090-4097</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>The modification of multispin casting multilayered barium titanate (BTO) thin films on indium tin oxide (ITO)/glass substrate without doping other elements is adopted to improve the memory performance. The X-ray photoelectron spectroscopy analysis reveals the concentration of oxygen vacancies can be reduced by the increasing number of the BTO layer. Mechanisms of conducting paths relating to the concentration of oxygen vacancies will also be explicated. The memory devices showed typical bipolar resistive switching behavior and an ON/OFF ratio of over 10 6 . The memory devices also exhibited outstanding uniformity. A retention time of over 10 5 s without fluctuation at room temperature and 85 °C can be achieved.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TED.2014.2363651</doi><tpages>8</tpages></addata></record> |
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subjects | Barium titanate (BTO) Electrodes Indium tin oxide memory multilayer resistive random access memory (RRAM) sol-gel Substrates Surface morphology Surface treatment Temperature measurement |
title | Multilayered Barium Titanate Thin Films by Sol-Gel Method for Nonvolatile Memory Application |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T09%3A32%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Multilayered%20Barium%20Titanate%20Thin%20Films%20by%20Sol-Gel%20Method%20for%20Nonvolatile%20Memory%20Application&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Chang,%20Yu-Chi&rft.date=2014-12-01&rft.volume=61&rft.issue=12&rft.spage=4090&rft.epage=4097&rft.pages=4090-4097&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/TED.2014.2363651&rft_dat=%3Cproquest_cross%3E3531105001%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c361t-ac653a65c5d8a30e9033016ad9cec9992155d98605e36f0add82bb9c9780dd493%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1637864736&rft_id=info:pmid/&rft_ieee_id=6949144&rfr_iscdi=true |