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Investigation of Ta 2 O 5 as an Alternative High- ${k}$ Dielectric for InAlN/GaN MOS-HEMT on Si
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Published in: | IEEE transactions on electron devices 2019-03, Vol.66 (3), p.1230-1235 |
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Main Authors: | , , , , , , , , |
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Language: | English |
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container_end_page | 1235 |
container_issue | 3 |
container_start_page | 1230 |
container_title | IEEE transactions on electron devices |
container_volume | 66 |
creator | Kumar, Sandeep Kumar, Himanshu Vura, Sandeep Pratiyush, Anamika Singh Charan, Vanjari Sai Dolmanan, Surani B. Tripathy, Sudhiranjan Muralidharan, Rangarajan Nath, Digbijoy N. |
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doi_str_mv | 10.1109/TED.2019.2893288 |
format | article |
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ispartof | IEEE transactions on electron devices, 2019-03, Vol.66 (3), p.1230-1235 |
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source | IEEE Electronic Library (IEL) Journals |
title | Investigation of Ta 2 O 5 as an Alternative High- ${k}$ Dielectric for InAlN/GaN MOS-HEMT on Si |
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