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Rigorous gain measurements on wide-band ridge horn
A rigorous measurement effort on the gain estimation of a wideband double-ridge horn antenna in the 2.0- to 4.8-GHz frequency range is presented. A systematic uncertainty analysis is carried out
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| Published in: | IEEE transactions on electromagnetic compatibility 2006-08, Vol.48 (3), p.592-594 |
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| Main Authors: | , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213 |
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| cites | cdi_FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213 |
| container_end_page | 594 |
| container_issue | 3 |
| container_start_page | 592 |
| container_title | IEEE transactions on electromagnetic compatibility |
| container_volume | 48 |
| creator | Venkatesan, V. Selvan, K.T. |
| description | A rigorous measurement effort on the gain estimation of a wideband double-ridge horn antenna in the 2.0- to 4.8-GHz frequency range is presented. A systematic uncertainty analysis is carried out |
| doi_str_mv | 10.1109/TEMC.2006.873863 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TEMC_2006_873863</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1677795</ieee_id><sourcerecordid>2340431371</sourcerecordid><originalsourceid>FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213</originalsourceid><addsrcrecordid>eNpdkEtLw0AURgdRsFb3gpsgiKvUeWReSyn1ARVBKrgbJslNnZJM6kyD-O-dkoLg6nK55_u4HIQuCZ4RgvXdavEyn1GMxUxJpgQ7QhPCucqJkh_HaIIxUblmkp-isxg3aS04ZRNE39y6D_0Qs7V1PuvAxiFAB34Xs95n366GvLS-zoKr15B99sGfo5PGthEuDnOK3h8Wq_lTvnx9fJ7fL_OKcbrLqSiFttYWRcV0yWnRqJpzzGitecE0U4BlVRfQFLqkALbAhDVcQkkSzShhU3Q79m5D_zVA3JnOxQra1npIDxulUgmlXCfy-h-56Yfg03NGCU4E10olCI9QFfoYAzRmG1xnw48h2OwVmr1Cs1doRoUpcnPotbGybROsr1z8yykstcIicVcj5wDg7yyklJqzX_tqd-U</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>865165988</pqid></control><display><type>article</type><title>Rigorous gain measurements on wide-band ridge horn</title><source>IEEE Xplore (Online service)</source><creator>Venkatesan, V. ; Selvan, K.T.</creator><creatorcontrib>Venkatesan, V. ; Selvan, K.T.</creatorcontrib><description>A rigorous measurement effort on the gain estimation of a wideband double-ridge horn antenna in the 2.0- to 4.8-GHz frequency range is presented. A systematic uncertainty analysis is carried out</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2006.873863</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Antennas ; Applied sciences ; Circuit properties ; Electric, optical and optoelectronic circuits ; Electromagnetic compatibility ; Electronics ; Exact sciences and technology ; Frequency ranges ; Gain ; Gain measurement ; Horn antennas ; Horns ; Information, signal and communications theory ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; ridged horn antenna ; Ridges ; Telecommunications and information theory ; Testing, measurement, noise and reliability ; Uncertainty ; Wideband</subject><ispartof>IEEE transactions on electromagnetic compatibility, 2006-08, Vol.48 (3), p.592-594</ispartof><rights>2007 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213</citedby><cites>FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1677795$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18079806$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Venkatesan, V.</creatorcontrib><creatorcontrib>Selvan, K.T.</creatorcontrib><title>Rigorous gain measurements on wide-band ridge horn</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>A rigorous measurement effort on the gain estimation of a wideband double-ridge horn antenna in the 2.0- to 4.8-GHz frequency range is presented. A systematic uncertainty analysis is carried out</description><subject>Antennas</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electromagnetic compatibility</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency ranges</subject><subject>Gain</subject><subject>Gain measurement</subject><subject>Horn antennas</subject><subject>Horns</subject><subject>Information, signal and communications theory</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>ridged horn antenna</subject><subject>Ridges</subject><subject>Telecommunications and information theory</subject><subject>Testing, measurement, noise and reliability</subject><subject>Uncertainty</subject><subject>Wideband</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNpdkEtLw0AURgdRsFb3gpsgiKvUeWReSyn1ARVBKrgbJslNnZJM6kyD-O-dkoLg6nK55_u4HIQuCZ4RgvXdavEyn1GMxUxJpgQ7QhPCucqJkh_HaIIxUblmkp-isxg3aS04ZRNE39y6D_0Qs7V1PuvAxiFAB34Xs95n366GvLS-zoKr15B99sGfo5PGthEuDnOK3h8Wq_lTvnx9fJ7fL_OKcbrLqSiFttYWRcV0yWnRqJpzzGitecE0U4BlVRfQFLqkALbAhDVcQkkSzShhU3Q79m5D_zVA3JnOxQra1npIDxulUgmlXCfy-h-56Yfg03NGCU4E10olCI9QFfoYAzRmG1xnw48h2OwVmr1Cs1doRoUpcnPotbGybROsr1z8yykstcIicVcj5wDg7yyklJqzX_tqd-U</recordid><startdate>20060801</startdate><enddate>20060801</enddate><creator>Venkatesan, V.</creator><creator>Selvan, K.T.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20060801</creationdate><title>Rigorous gain measurements on wide-band ridge horn</title><author>Venkatesan, V. ; Selvan, K.T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Antennas</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electromagnetic compatibility</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency ranges</topic><topic>Gain</topic><topic>Gain measurement</topic><topic>Horn antennas</topic><topic>Horns</topic><topic>Information, signal and communications theory</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>ridged horn antenna</topic><topic>Ridges</topic><topic>Telecommunications and information theory</topic><topic>Testing, measurement, noise and reliability</topic><topic>Uncertainty</topic><topic>Wideband</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Venkatesan, V.</creatorcontrib><creatorcontrib>Selvan, K.T.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Venkatesan, V.</au><au>Selvan, K.T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Rigorous gain measurements on wide-band ridge horn</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2006-08-01</date><risdate>2006</risdate><volume>48</volume><issue>3</issue><spage>592</spage><epage>594</epage><pages>592-594</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>A rigorous measurement effort on the gain estimation of a wideband double-ridge horn antenna in the 2.0- to 4.8-GHz frequency range is presented. A systematic uncertainty analysis is carried out</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TEMC.2006.873863</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0018-9375 |
| ispartof | IEEE transactions on electromagnetic compatibility, 2006-08, Vol.48 (3), p.592-594 |
| issn | 0018-9375 1558-187X |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_TEMC_2006_873863 |
| source | IEEE Xplore (Online service) |
| subjects | Antennas Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electromagnetic compatibility Electronics Exact sciences and technology Frequency ranges Gain Gain measurement Horn antennas Horns Information, signal and communications theory Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ridged horn antenna Ridges Telecommunications and information theory Testing, measurement, noise and reliability Uncertainty Wideband |
| title | Rigorous gain measurements on wide-band ridge horn |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T16%3A54%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Rigorous%20gain%20measurements%20on%20wide-band%20ridge%20horn&rft.jtitle=IEEE%20transactions%20on%20electromagnetic%20compatibility&rft.au=Venkatesan,%20V.&rft.date=2006-08-01&rft.volume=48&rft.issue=3&rft.spage=592&rft.epage=594&rft.pages=592-594&rft.issn=0018-9375&rft.eissn=1558-187X&rft.coden=IEMCAE&rft_id=info:doi/10.1109/TEMC.2006.873863&rft_dat=%3Cproquest_cross%3E2340431371%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c352t-26b69aaa44c39b524f8d55032d9543938e07cd4ef49b2eea4013f57eb19b53213%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=865165988&rft_id=info:pmid/&rft_ieee_id=1677795&rfr_iscdi=true |