Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques

In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 1970-11, Vol.19 (4), p.377-382
Main Authors: Nicolson, A. M., Ross, G. F.
Format: Article
Language:English
Subjects:
Erbium
Fixtures
Frequency domain analysis
Frequency measurement
Impedance
Microwave theory and techniques
Permeability measurement
Permittivity measurement
Scattering
Time domain analysis
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Summary:In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.1970.4313932