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Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques

In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in...

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Published in:IEEE transactions on instrumentation and measurement 1970-11, Vol.19 (4), p.377-382
Main Authors: Nicolson, A. M., Ross, G. F.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893
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container_title IEEE transactions on instrumentation and measurement
container_volume 19
creator Nicolson, A. M.
Ross, G. F.
description In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.
doi_str_mv 10.1109/TIM.1970.4313932
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fullrecord <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TIM_1970_4313932</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4313932</ieee_id><sourcerecordid>10_1109_TIM_1970_4313932</sourcerecordid><originalsourceid>FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</originalsourceid><addsrcrecordid>eNo9kD1PwzAURS0EEqWwI7H4DyS8Z8d2PKLyVakFhjBHjvuiGpGk2OnQf0-rFqY73HvucBi7RcgRwd5X82WO1kBeSJRWijM2QaVMZrUW52wCgGVmC6Uv2VVKXwBgdGEm7G1JLm0jddSPfGj5uCY-78cY-hQ8_4jDhuIYKB26pRspBvedeLPjVegoexw6F3pekV_34WdL6ZpdtPsB3Zxyyj6fn6rZa7Z4f5nPHhaZl6YYMye1WEELpdDKq8Z7YYRwpQGjtCGBZEvw6ByUK7cyiIUnQGzQaO-ULK2cMjj--jikFKmtNzF0Lu5qhPrgo977qA8-6pOPPXJ3RAIR_c__2l9USlvO</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</title><source>IEEE Xplore (Online service)</source><creator>Nicolson, A. M. ; Ross, G. F.</creator><creatorcontrib>Nicolson, A. M. ; Ross, G. F.</creatorcontrib><description>In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.1970.4313932</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>IEEE</publisher><subject>Erbium ; Fixtures ; Frequency domain analysis ; Frequency measurement ; Impedance ; Microwave theory and techniques ; Permeability measurement ; Permittivity measurement ; Scattering ; Time domain analysis</subject><ispartof>IEEE transactions on instrumentation and measurement, 1970-11, Vol.19 (4), p.377-382</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</citedby><cites>FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4313932$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Nicolson, A. M.</creatorcontrib><creatorcontrib>Ross, G. F.</creatorcontrib><title>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.</description><subject>Erbium</subject><subject>Fixtures</subject><subject>Frequency domain analysis</subject><subject>Frequency measurement</subject><subject>Impedance</subject><subject>Microwave theory and techniques</subject><subject>Permeability measurement</subject><subject>Permittivity measurement</subject><subject>Scattering</subject><subject>Time domain analysis</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1970</creationdate><recordtype>article</recordtype><recordid>eNo9kD1PwzAURS0EEqWwI7H4DyS8Z8d2PKLyVakFhjBHjvuiGpGk2OnQf0-rFqY73HvucBi7RcgRwd5X82WO1kBeSJRWijM2QaVMZrUW52wCgGVmC6Uv2VVKXwBgdGEm7G1JLm0jddSPfGj5uCY-78cY-hQ8_4jDhuIYKB26pRspBvedeLPjVegoexw6F3pekV_34WdL6ZpdtPsB3Zxyyj6fn6rZa7Z4f5nPHhaZl6YYMye1WEELpdDKq8Z7YYRwpQGjtCGBZEvw6ByUK7cyiIUnQGzQaO-ULK2cMjj--jikFKmtNzF0Lu5qhPrgo977qA8-6pOPPXJ3RAIR_c__2l9USlvO</recordid><startdate>197011</startdate><enddate>197011</enddate><creator>Nicolson, A. M.</creator><creator>Ross, G. F.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>197011</creationdate><title>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</title><author>Nicolson, A. M. ; Ross, G. F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1970</creationdate><topic>Erbium</topic><topic>Fixtures</topic><topic>Frequency domain analysis</topic><topic>Frequency measurement</topic><topic>Impedance</topic><topic>Microwave theory and techniques</topic><topic>Permeability measurement</topic><topic>Permittivity measurement</topic><topic>Scattering</topic><topic>Time domain analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nicolson, A. M.</creatorcontrib><creatorcontrib>Ross, G. F.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nicolson, A. M.</au><au>Ross, G. F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1970-11</date><risdate>1970</risdate><volume>19</volume><issue>4</issue><spage>377</spage><epage>382</epage><pages>377-382</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.</abstract><pub>IEEE</pub><doi>10.1109/TIM.1970.4313932</doi><tpages>6</tpages></addata></record>
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subjects Erbium
Fixtures
Frequency domain analysis
Frequency measurement
Impedance
Microwave theory and techniques
Permeability measurement
Permittivity measurement
Scattering
Time domain analysis
title Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T23%3A14%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20the%20Intrinsic%20Properties%20of%20Materials%20by%20Time-Domain%20Techniques&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Nicolson,%20A.%20M.&rft.date=1970-11&rft.volume=19&rft.issue=4&rft.spage=377&rft.epage=382&rft.pages=377-382&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/TIM.1970.4313932&rft_dat=%3Ccrossref_ieee_%3E10_1109_TIM_1970_4313932%3C/crossref_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4313932&rfr_iscdi=true