Loading…
Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques
In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in...
Saved in:
Published in: | IEEE transactions on instrumentation and measurement 1970-11, Vol.19 (4), p.377-382 |
---|---|
Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893 |
---|---|
cites | cdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893 |
container_end_page | 382 |
container_issue | 4 |
container_start_page | 377 |
container_title | IEEE transactions on instrumentation and measurement |
container_volume | 19 |
creator | Nicolson, A. M. Ross, G. F. |
description | In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials. |
doi_str_mv | 10.1109/TIM.1970.4313932 |
format | article |
fullrecord | <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TIM_1970_4313932</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4313932</ieee_id><sourcerecordid>10_1109_TIM_1970_4313932</sourcerecordid><originalsourceid>FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</originalsourceid><addsrcrecordid>eNo9kD1PwzAURS0EEqWwI7H4DyS8Z8d2PKLyVakFhjBHjvuiGpGk2OnQf0-rFqY73HvucBi7RcgRwd5X82WO1kBeSJRWijM2QaVMZrUW52wCgGVmC6Uv2VVKXwBgdGEm7G1JLm0jddSPfGj5uCY-78cY-hQ8_4jDhuIYKB26pRspBvedeLPjVegoexw6F3pekV_34WdL6ZpdtPsB3Zxyyj6fn6rZa7Z4f5nPHhaZl6YYMye1WEELpdDKq8Z7YYRwpQGjtCGBZEvw6ByUK7cyiIUnQGzQaO-ULK2cMjj--jikFKmtNzF0Lu5qhPrgo977qA8-6pOPPXJ3RAIR_c__2l9USlvO</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</title><source>IEEE Xplore (Online service)</source><creator>Nicolson, A. M. ; Ross, G. F.</creator><creatorcontrib>Nicolson, A. M. ; Ross, G. F.</creatorcontrib><description>In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.1970.4313932</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>IEEE</publisher><subject>Erbium ; Fixtures ; Frequency domain analysis ; Frequency measurement ; Impedance ; Microwave theory and techniques ; Permeability measurement ; Permittivity measurement ; Scattering ; Time domain analysis</subject><ispartof>IEEE transactions on instrumentation and measurement, 1970-11, Vol.19 (4), p.377-382</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</citedby><cites>FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4313932$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Nicolson, A. M.</creatorcontrib><creatorcontrib>Ross, G. F.</creatorcontrib><title>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.</description><subject>Erbium</subject><subject>Fixtures</subject><subject>Frequency domain analysis</subject><subject>Frequency measurement</subject><subject>Impedance</subject><subject>Microwave theory and techniques</subject><subject>Permeability measurement</subject><subject>Permittivity measurement</subject><subject>Scattering</subject><subject>Time domain analysis</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1970</creationdate><recordtype>article</recordtype><recordid>eNo9kD1PwzAURS0EEqWwI7H4DyS8Z8d2PKLyVakFhjBHjvuiGpGk2OnQf0-rFqY73HvucBi7RcgRwd5X82WO1kBeSJRWijM2QaVMZrUW52wCgGVmC6Uv2VVKXwBgdGEm7G1JLm0jddSPfGj5uCY-78cY-hQ8_4jDhuIYKB26pRspBvedeLPjVegoexw6F3pekV_34WdL6ZpdtPsB3Zxyyj6fn6rZa7Z4f5nPHhaZl6YYMye1WEELpdDKq8Z7YYRwpQGjtCGBZEvw6ByUK7cyiIUnQGzQaO-ULK2cMjj--jikFKmtNzF0Lu5qhPrgo977qA8-6pOPPXJ3RAIR_c__2l9USlvO</recordid><startdate>197011</startdate><enddate>197011</enddate><creator>Nicolson, A. M.</creator><creator>Ross, G. F.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>197011</creationdate><title>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</title><author>Nicolson, A. M. ; Ross, G. F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1970</creationdate><topic>Erbium</topic><topic>Fixtures</topic><topic>Frequency domain analysis</topic><topic>Frequency measurement</topic><topic>Impedance</topic><topic>Microwave theory and techniques</topic><topic>Permeability measurement</topic><topic>Permittivity measurement</topic><topic>Scattering</topic><topic>Time domain analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nicolson, A. M.</creatorcontrib><creatorcontrib>Ross, G. F.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nicolson, A. M.</au><au>Ross, G. F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1970-11</date><risdate>1970</risdate><volume>19</volume><issue>4</issue><spage>377</spage><epage>382</epage><pages>377-382</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.</abstract><pub>IEEE</pub><doi>10.1109/TIM.1970.4313932</doi><tpages>6</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9456 |
ispartof | IEEE transactions on instrumentation and measurement, 1970-11, Vol.19 (4), p.377-382 |
issn | 0018-9456 1557-9662 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TIM_1970_4313932 |
source | IEEE Xplore (Online service) |
subjects | Erbium Fixtures Frequency domain analysis Frequency measurement Impedance Microwave theory and techniques Permeability measurement Permittivity measurement Scattering Time domain analysis |
title | Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T23%3A14%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20the%20Intrinsic%20Properties%20of%20Materials%20by%20Time-Domain%20Techniques&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Nicolson,%20A.%20M.&rft.date=1970-11&rft.volume=19&rft.issue=4&rft.spage=377&rft.epage=382&rft.pages=377-382&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/TIM.1970.4313932&rft_dat=%3Ccrossref_ieee_%3E10_1109_TIM_1970_4313932%3C/crossref_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c374t-a362d0f08265c5bcc2722a8707567e21e980c1aa08dad7114ce011b176ca53893%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4313932&rfr_iscdi=true |