Intrinsic sensitivity of Cd/sub 1-x/Zn/sub x/Te semiconductors for digital radiographic imaging

The intrinsic sensitivity of cadmium zinc telluride (Cd/sub 1-x/Zn/sub x/Te) semiconductor detectors has been experimentally measured, within the X-ray diagnostic energy range. The results of this study indicate that the intrinsic efficiency of Cd/sub 1-x/Zn/sub x/Te can be increased by optimizing g...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2003-10, Vol.52 (5), p.1559-1565
Main Authors: Giakos, G.C., Guntupalli, R., De Abreu-Garcia, J.A., Shah, N., Vedantham, S., Suryanarayanan, S., Chowdhury, S., Patnekar, N., Sumrain, S., Mehta, K., Evans, E., Orozco, A., Kumar, V., Ugweje, O., Moholkar, A.
Format: Article
Language:English
Subjects:
Biomedical optical imaging
Image sensors
Optical imaging
Optical sensors
Radiography
Tellurium
X-ray detection
X-ray detectors
X-ray imaging
Zinc
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Summary:The intrinsic sensitivity of cadmium zinc telluride (Cd/sub 1-x/Zn/sub x/Te) semiconductor detectors has been experimentally measured, within the X-ray diagnostic energy range. The results of this study indicate that the intrinsic efficiency of Cd/sub 1-x/Zn/sub x/Te can be increased by optimizing geometrical and physical detection parameters such as X-ray irradiation geometry, detector thickness, and applied electric field. These results indicate that Cd/sub 1-x/Zn/sub x/Te is a suitable candidate for digital imaging applications.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2003.818563