Guest Editorial Special Issue on the 2015 IEEE International Instrumentation and Measurement Technology Conference Pisa, Italy, May 11-14, 2015

The 32nd annual IEEE International Instrumentation and Measurement Technology Conference ( \text{I}^{2} MTC) was held in historic and beautiful Pisa, Italy. The theme of the conference was "The Measurable of Tomorrow: Providing a Better Perspective on Complex Systems." The first part of th...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2016-05, Vol.65 (5), p.958-959
Main Authors: Shirmohammadi, Shervin, Daponte, Pasquale, Van Moer, Wendy
Format: Article
Language:English
Subjects:
Complex systems
Instrumentation and measurement
Meetings
Special issues and sections
Online Access:Get full text
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Summary:The 32nd annual IEEE International Instrumentation and Measurement Technology Conference ( \text{I}^{2} MTC) was held in historic and beautiful Pisa, Italy. The theme of the conference was "The Measurable of Tomorrow: Providing a Better Perspective on Complex Systems." The first part of the title embraced the challenge of Galileo Galilei, "Measure what is measurable, and make measurable what is not so," while the second part called for the instrumentation and measurement (I&M) community to face the increasing complexity of systems resulting from the continuous development of new technologies.
ISSN:0018-9456
1557-9662
1557-9662
DOI:10.1109/TIM.2016.2539458