Translation Matching Method for Obtaining the Refractive Index of Chalcogenide Films Based on the Transmission Spectra

The translation matching method (TMM) was presented here to obtain the refractive index (RI) of chalcogenide films more accurately. It solved the problem of calculation errors of the RI of the film that resulted from using the Swanepoel method after conventional treatments such as illumination, elec...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2021, Vol.70, p.1-7
Main Authors: Pan, Lei, Song, Baoan, Xiao, Chuanfu, Mao, Ning, Lin, Changgui, Zhang, Peiqing, Shen, Xiang, Dai, Shixun
Format: Article
Language:English
Subjects:
Annealing
Chalcogenide films
Chalcogenides
Direct laser writing
Electrical measurement
femtosecond (fs) laser irradiation
heat treatment
Matching
Mathematical analysis
Refractive index
refractive index (RI) measurement
Refractivity
Rough surfaces
Scattering
Surface roughness
Thickness measurement
Thin films
transmission spectra
Ultrafast optics
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Summary:The translation matching method (TMM) was presented here to obtain the refractive index (RI) of chalcogenide films more accurately. It solved the problem of calculation errors of the RI of the film that resulted from using the Swanepoel method after conventional treatments such as illumination, electrical measurement, and annealing. The TMM was suitable for calculating the RI of the film by calibrating the transmission spectrum regardless of whether it had been dealt with. The accuracy of the RI calculation is about 0.1% using the method. Experimentally, the method was used to obtain the RI of three chalcogenide films: they are original homogeneous film and RI nonuniform film treated by annealing and by femtosecond laser direct writing, respectively. The results showed that the decrease in the transmittance and weakened interference effect were effectively overcome and the RI of the three kinds of films was accurately obtained by using the method. This work should provide a useful guideline for obtaining the RI of the transparent optical films.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2021.3088483