Advancing Nanoscale Imaging: A 100-GHz Ultramicroscopy System Based on Nonfocusing Zero-Intermediate Frequency Radar Technology

A scattering-scanning near-field microscope, integrated with a 100-GHz zero-intermediate frequency (zero-IF) radar system, is proposed and demonstrated. Near-field imaging with a resolution of 140 nm is achieved through the utilization of a fundamental mixer. The nonfocusing structure simplifies the...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2024, Vol.73, p.1-9
Main Authors: Peng, Zhaomin, Ge, Shuqi, Meng, Jin, Liu, Zhe, Zhang, Dehai
Format: Article
Language:English
Subjects:
Focusing
Image resolution
Low terahertz band
Mixers
near-field microscopy
nonfocusing
Optical scattering
Radar imaging
Terahertz radiation
Vibrations
zero-intermediate frequency (zero-IF) radar system
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Summary:A scattering-scanning near-field microscope, integrated with a 100-GHz zero-intermediate frequency (zero-IF) radar system, is proposed and demonstrated. Near-field imaging with a resolution of 140 nm is achieved through the utilization of a fundamental mixer. The nonfocusing structure simplifies the original focusing optical path and, combined with single-source zero-IF radar technology, streamlines the overall system structure while ensuring data collection efficiency. This facilitates subsequent system integration. The impacts on the actual excitation and collection of near-field signals were compared between the focusing mode and the nonfocusing mode. Subsequently, near-field imaging in the nonfocusing mode was successfully accomplished. A signal-to-noise ratio (SNR) of 35 dB in near-field amplitude images is attained by using commercial probes. This indicates that the unique system structure can provide a new solution for low-terahertz bans scanning near-field microscopes.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2024.3449942