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Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape

A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according...

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Published in:	IEEE translation journal on magnetics in Japan 1991-09, Vol.6 (9), p.744-751
Main Authors:	Satoh, Y., Shikama, S., Soutome, Y., Ohtsubo, A.
Format:	Article
Language:	English
Subjects:	Anisotropic magnetoresistance Applied sciences Contacts Electronics Exact sciences and technology Face detection Geometrical optics Lips Magnetic heads Optical films Optical polarization Optical reflection Optical surface waves Recording and replay of audio and video signals Storage and reproduction of information
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cites	cdi_FETCH-LOGICAL-c2025-c7aaf4f5561c26d38405706bcc7447f1ea8789e779a9e32d461c8f639e7ff5313
container_end_page	751
container_issue	9
container_start_page	744
container_title	IEEE translation journal on magnetics in Japan
container_volume	6
creator	Satoh, Y. Shikama, S. Soutome, Y. Ohtsubo, A.
description	A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according to this method of evaluation exhibited higher density wavelength response characteristics.
doi_str_mv	10.1109/TJMJ.1991.4565245
format	article
fullrecord	<record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TJMJ_1991_4565245</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4565245</ieee_id><sourcerecordid>5096428</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2025-c7aaf4f5561c26d38405706bcc7447f1ea8789e779a9e32d461c8f639e7ff5313</originalsourceid><addsrcrecordid>eNo9kE1PwkAQhjdGEwnyA4yXPXgt7mfbPRL8gpTQCJ6bdTuLa6BtdksM_npbQeYyyczzPocXoVtKxpQS9bCeL-ZjqhQdCxlLJuQFGjCeyIhIIS_RgKQpi4SS6hqNQvgi3XBOmVAD9L0AHfYedlC1uLb4DewWTOvqCk8qF-rW182hf-T1Vnv3AyXO3Oazxbb2-BHanq02eLX3VhvAOfgGqtKZfUfjpXedVv_ZXIUXeZTN8hVe6wZu0JXV2wCj0x6i9-en9fQ1ypYvs-kkiwwjTEYm0doKK2VMDYtLngoiExJ_GJMIkVgKOk1SBUmitALOStFxqY15d7JWcsqHiB69xtcheLBF491O-0NBSdGXV_TlFX15xam8LnN_zDQ6GL21XlfGhXNQEhULlnbY3RFzAHD-_kt-AU3SeIc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape</title><source>IEEE Xplore (Online service)</source><creator>Satoh, Y. ; Shikama, S. ; Soutome, Y. ; Ohtsubo, A.</creator><creatorcontrib>Satoh, Y. ; Shikama, S. ; Soutome, Y. ; Ohtsubo, A.</creatorcontrib><description>A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according to this method of evaluation exhibited higher density wavelength response characteristics.</description><identifier>ISSN: 0882-4959</identifier><identifier>EISSN: 2375-0545</identifier><identifier>DOI: 10.1109/TJMJ.1991.4565245</identifier><identifier>CODEN: ITJJER</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Anisotropic magnetoresistance ; Applied sciences ; Contacts ; Electronics ; Exact sciences and technology ; Face detection ; Geometrical optics ; Lips ; Magnetic heads ; Optical films ; Optical polarization ; Optical reflection ; Optical surface waves ; Recording and replay of audio and video signals ; Storage and reproduction of information</subject><ispartof>IEEE translation journal on magnetics in Japan, 1991-09, Vol.6 (9), p.744-751</ispartof><rights>1992 INIST-CNRS</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2025-c7aaf4f5561c26d38405706bcc7447f1ea8789e779a9e32d461c8f639e7ff5313</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4565245$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,54775</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5096428$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Satoh, Y.</creatorcontrib><creatorcontrib>Shikama, S.</creatorcontrib><creatorcontrib>Soutome, Y.</creatorcontrib><creatorcontrib>Ohtsubo, A.</creatorcontrib><title>Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape</title><title>IEEE translation journal on magnetics in Japan</title><addtitle>TJ-MJ</addtitle><description>A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according to this method of evaluation exhibited higher density wavelength response characteristics.</description><subject>Anisotropic magnetoresistance</subject><subject>Applied sciences</subject><subject>Contacts</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Face detection</subject><subject>Geometrical optics</subject><subject>Lips</subject><subject>Magnetic heads</subject><subject>Optical films</subject><subject>Optical polarization</subject><subject>Optical reflection</subject><subject>Optical surface waves</subject><subject>Recording and replay of audio and video signals</subject><subject>Storage and reproduction of information</subject><issn>0882-4959</issn><issn>2375-0545</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNo9kE1PwkAQhjdGEwnyA4yXPXgt7mfbPRL8gpTQCJ6bdTuLa6BtdksM_npbQeYyyczzPocXoVtKxpQS9bCeL-ZjqhQdCxlLJuQFGjCeyIhIIS_RgKQpi4SS6hqNQvgi3XBOmVAD9L0AHfYedlC1uLb4DewWTOvqCk8qF-rW182hf-T1Vnv3AyXO3Oazxbb2-BHanq02eLX3VhvAOfgGqtKZfUfjpXedVv_ZXIUXeZTN8hVe6wZu0JXV2wCj0x6i9-en9fQ1ypYvs-kkiwwjTEYm0doKK2VMDYtLngoiExJ_GJMIkVgKOk1SBUmitALOStFxqY15d7JWcsqHiB69xtcheLBF491O-0NBSdGXV_TlFX15xam8LnN_zDQ6GL21XlfGhXNQEhULlnbY3RFzAHD-_kt-AU3SeIc</recordid><startdate>199109</startdate><enddate>199109</enddate><creator>Satoh, Y.</creator><creator>Shikama, S.</creator><creator>Soutome, Y.</creator><creator>Ohtsubo, A.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>199109</creationdate><title>Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape</title><author>Satoh, Y. ; Shikama, S. ; Soutome, Y. ; Ohtsubo, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2025-c7aaf4f5561c26d38405706bcc7447f1ea8789e779a9e32d461c8f639e7ff5313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Anisotropic magnetoresistance</topic><topic>Applied sciences</topic><topic>Contacts</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Face detection</topic><topic>Geometrical optics</topic><topic>Lips</topic><topic>Magnetic heads</topic><topic>Optical films</topic><topic>Optical polarization</topic><topic>Optical reflection</topic><topic>Optical surface waves</topic><topic>Recording and replay of audio and video signals</topic><topic>Storage and reproduction of information</topic><toplevel>online_resources</toplevel><creatorcontrib>Satoh, Y.</creatorcontrib><creatorcontrib>Shikama, S.</creatorcontrib><creatorcontrib>Soutome, Y.</creatorcontrib><creatorcontrib>Ohtsubo, A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>IEEE translation journal on magnetics in Japan</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Satoh, Y.</au><au>Shikama, S.</au><au>Soutome, Y.</au><au>Ohtsubo, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape</atitle><jtitle>IEEE translation journal on magnetics in Japan</jtitle><stitle>TJ-MJ</stitle><date>1991-09</date><risdate>1991</risdate><volume>6</volume><issue>9</issue><spage>744</spage><epage>751</epage><pages>744-751</pages><issn>0882-4959</issn><eissn>2375-0545</eissn><coden>ITJJER</coden><abstract>A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according to this method of evaluation exhibited higher density wavelength response characteristics.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TJMJ.1991.4565245</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record>
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ispartof	IEEE translation journal on magnetics in Japan, 1991-09, Vol.6 (9), p.744-751
issn	0882-4959 2375-0545
language	eng
recordid	cdi_crossref_primary_10_1109_TJMJ_1991_4565245
source	IEEE Xplore (Online service)
subjects	Anisotropic magnetoresistance Applied sciences Contacts Electronics Exact sciences and technology Face detection Geometrical optics Lips Magnetic heads Optical films Optical polarization Optical reflection Optical surface waves Recording and replay of audio and video signals Storage and reproduction of information
title	Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T10%3A06%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20Reflection%20Anisotropy%20of%20Polarized%20Light%20for%20Detecting%20Surface%20Perpendicular%20Orientation%20in%20MP-LIPS%20Tape&rft.jtitle=IEEE%20translation%20journal%20on%20magnetics%20in%20Japan&rft.au=Satoh,%20Y.&rft.date=1991-09&rft.volume=6&rft.issue=9&rft.spage=744&rft.epage=751&rft.pages=744-751&rft.issn=0882-4959&rft.eissn=2375-0545&rft.coden=ITJJER&rft_id=info:doi/10.1109/TJMJ.1991.4565245&rft_dat=%3Cpascalfrancis_cross%3E5096428%3C/pascalfrancis_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2025-c7aaf4f5561c26d38405706bcc7447f1ea8789e779a9e32d461c8f639e7ff5313%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4565245&rfr_iscdi=true