Loading…

Finite element analysis of the skin effect in current carrying conductors

The current density distribution in a conductor of finite size is affected by the presence of eddy currents in the conductor. This phenomenon, generally known as skin effect, causes ohmic losses in the conductors and alters their magnetic induction. This paper presents an analysis of skin effect phe...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on magnetics 1977-09, Vol.13 (5), p.1125-1127
Main Authors: Chari, M., Csendes, Z.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3
cites cdi_FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3
container_end_page 1127
container_issue 5
container_start_page 1125
container_title IEEE transactions on magnetics
container_volume 13
creator Chari, M.
Csendes, Z.
description The current density distribution in a conductor of finite size is affected by the presence of eddy currents in the conductor. This phenomenon, generally known as skin effect, causes ohmic losses in the conductors and alters their magnetic induction. This paper presents an analysis of skin effect phenomena using the triangular finite element method. The results obtained by this method are compared with those of classical one-dimensional analysis for (i) a conductor in free space and (ii) a conductor in the presence of an iron boundary.
doi_str_mv 10.1109/TMAG.1977.1059545
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TMAG_1977_1059545</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1059545</ieee_id><sourcerecordid>28317708</sourcerecordid><originalsourceid>FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3</originalsourceid><addsrcrecordid>eNpNkLFOwzAQhi0EEqXwAIjFE1uKHduxPVYVLUhFLGW2HPcMhtQpdjL07UmUDkx3p_v-k-5D6J6SBaVEP-3elpsF1VIuKBFacHGBZlRzWhBS6Us0I4SqQvOKX6ObnL-HkQtKZuh1HWLoAEMDB4gdttE2pxwybj3uvgDnnxAxeA-uw0Pn-pRGzNmUTiF-YtfGfe-6NuVbdOVtk-HuXOfoY_28W70U2_fN62q5LRyrSFdwWQqltC-l5qwG5aTlFmTNKuCV0ESW9fCFgtpLBkx4xWpf-n1puRZ1JYHN0eN095ja3x5yZw4hO2gaG6HtsykVo1ISNYB0Al1qc07gzTGFg00nQ4kZpZlRmhmlmbO0IfMwZQIA_OOn7R9YIWif</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28317708</pqid></control><display><type>article</type><title>Finite element analysis of the skin effect in current carrying conductors</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Chari, M. ; Csendes, Z.</creator><creatorcontrib>Chari, M. ; Csendes, Z.</creatorcontrib><description>The current density distribution in a conductor of finite size is affected by the presence of eddy currents in the conductor. This phenomenon, generally known as skin effect, causes ohmic losses in the conductors and alters their magnetic induction. This paper presents an analysis of skin effect phenomena using the triangular finite element method. The results obtained by this method are compared with those of classical one-dimensional analysis for (i) a conductor in free space and (ii) a conductor in the presence of an iron boundary.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.1977.1059545</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conducting materials ; Conductors ; Current density ; Eddy currents ; Equations ; Finite element methods ; Iron ; Magnetic analysis ; Permeability ; Skin effect</subject><ispartof>IEEE transactions on magnetics, 1977-09, Vol.13 (5), p.1125-1127</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3</citedby><cites>FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1059545$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,54774</link.rule.ids></links><search><creatorcontrib>Chari, M.</creatorcontrib><creatorcontrib>Csendes, Z.</creatorcontrib><title>Finite element analysis of the skin effect in current carrying conductors</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>The current density distribution in a conductor of finite size is affected by the presence of eddy currents in the conductor. This phenomenon, generally known as skin effect, causes ohmic losses in the conductors and alters their magnetic induction. This paper presents an analysis of skin effect phenomena using the triangular finite element method. The results obtained by this method are compared with those of classical one-dimensional analysis for (i) a conductor in free space and (ii) a conductor in the presence of an iron boundary.</description><subject>Conducting materials</subject><subject>Conductors</subject><subject>Current density</subject><subject>Eddy currents</subject><subject>Equations</subject><subject>Finite element methods</subject><subject>Iron</subject><subject>Magnetic analysis</subject><subject>Permeability</subject><subject>Skin effect</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1977</creationdate><recordtype>article</recordtype><recordid>eNpNkLFOwzAQhi0EEqXwAIjFE1uKHduxPVYVLUhFLGW2HPcMhtQpdjL07UmUDkx3p_v-k-5D6J6SBaVEP-3elpsF1VIuKBFacHGBZlRzWhBS6Us0I4SqQvOKX6ObnL-HkQtKZuh1HWLoAEMDB4gdttE2pxwybj3uvgDnnxAxeA-uw0Pn-pRGzNmUTiF-YtfGfe-6NuVbdOVtk-HuXOfoY_28W70U2_fN62q5LRyrSFdwWQqltC-l5qwG5aTlFmTNKuCV0ESW9fCFgtpLBkx4xWpf-n1puRZ1JYHN0eN095ja3x5yZw4hO2gaG6HtsykVo1ISNYB0Al1qc07gzTGFg00nQ4kZpZlRmhmlmbO0IfMwZQIA_OOn7R9YIWif</recordid><startdate>19770901</startdate><enddate>19770901</enddate><creator>Chari, M.</creator><creator>Csendes, Z.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19770901</creationdate><title>Finite element analysis of the skin effect in current carrying conductors</title><author>Chari, M. ; Csendes, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1977</creationdate><topic>Conducting materials</topic><topic>Conductors</topic><topic>Current density</topic><topic>Eddy currents</topic><topic>Equations</topic><topic>Finite element methods</topic><topic>Iron</topic><topic>Magnetic analysis</topic><topic>Permeability</topic><topic>Skin effect</topic><toplevel>online_resources</toplevel><creatorcontrib>Chari, M.</creatorcontrib><creatorcontrib>Csendes, Z.</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chari, M.</au><au>Csendes, Z.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Finite element analysis of the skin effect in current carrying conductors</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1977-09-01</date><risdate>1977</risdate><volume>13</volume><issue>5</issue><spage>1125</spage><epage>1127</epage><pages>1125-1127</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>The current density distribution in a conductor of finite size is affected by the presence of eddy currents in the conductor. This phenomenon, generally known as skin effect, causes ohmic losses in the conductors and alters their magnetic induction. This paper presents an analysis of skin effect phenomena using the triangular finite element method. The results obtained by this method are compared with those of classical one-dimensional analysis for (i) a conductor in free space and (ii) a conductor in the presence of an iron boundary.</abstract><pub>IEEE</pub><doi>10.1109/TMAG.1977.1059545</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0018-9464
ispartof IEEE transactions on magnetics, 1977-09, Vol.13 (5), p.1125-1127
issn 0018-9464
1941-0069
language eng
recordid cdi_crossref_primary_10_1109_TMAG_1977_1059545
source IEEE Electronic Library (IEL) Journals
subjects Conducting materials
Conductors
Current density
Eddy currents
Equations
Finite element methods
Iron
Magnetic analysis
Permeability
Skin effect
title Finite element analysis of the skin effect in current carrying conductors
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T06%3A01%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Finite%20element%20analysis%20of%20the%20skin%20effect%20in%20current%20carrying%20conductors&rft.jtitle=IEEE%20transactions%20on%20magnetics&rft.au=Chari,%20M.&rft.date=1977-09-01&rft.volume=13&rft.issue=5&rft.spage=1125&rft.epage=1127&rft.pages=1125-1127&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/TMAG.1977.1059545&rft_dat=%3Cproquest_cross%3E28317708%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c360t-4725889f27943be8c7a4ae7b36e4659072b9778ebf73e35f83bf2fd2a495b67e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=28317708&rft_id=info:pmid/&rft_ieee_id=1059545&rfr_iscdi=true