Novel profiling model and side effects of helical scan silicon heads

Partial erasure of track edges was directly measured from triple-track patterns using a novel model to interpret the output profiles. The model is based on representing the read head as the sum of a reference width, wavelength independent, and two side reading effective widths that are wavelength de...

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Bibliographic Details
Published in:IEEE transactions on magnetics 2002-09, Vol.38 (5), p.1916-1918
Main Authors: Hozoi, A., Groenland, J.P.J., Albertini, J.B., Lodder, J.C.
Format: Article
Language:English
Subjects:
Applied sciences
Electron microscopy
Electronics
Exact sciences and technology
Magnetic anisotropy
Magnetic devices
Magnetic force microscopy
Magnetic heads
Magnetic recording
Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.)
domain-motion devices, etc
Magnetism
Magnetosphere
Perpendicular magnetic anisotropy
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Silicon
Wavelength measurement
Writing
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Summary:Partial erasure of track edges was directly measured from triple-track patterns using a novel model to interpret the output profiles. The model is based on representing the read head as the sum of a reference width, wavelength independent, and two side reading effective widths that are wavelength dependent. We applied this technique to measure erase bands and side read widths of an advanced helical scan silicon head with 3.5-/spl mu/m pole width, in combination with metal particle tape with coercivity H/sub c/ = 135 kA/m. The good pole alignment of the head minimizes side effects and we report an erase band of 0.3 /spl mu/m for a 0.5-/spl mu/m wavelength track overwriting the edge of a track having the same wavelength.
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2002.802811