Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture

In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for...

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Bibliographic Details
Published in:IEEE transactions on magnetics 2011-10, Vol.47 (10), p.3975-3978
Main Authors: Menicanin, Aleksandar B., Damnjanovic, Mirjana S., Zivanov, Ljiljana D., Aleksic, Obrad S.
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Electromagnetic interference
Electromagnetic interference (EMI)
Exact sciences and technology
Inductors
Integrated circuit modeling
LC filters
Materials science
Microstrip
Microwave filters
modeling
Other topics in materials science
Physics
scattering parameters
Semiconductor device measurement
Solid modeling
test fixture
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Summary:In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2011.2150738