A High-Resolution Swept-Frequency Reflectometer

A simple swept-frequency reflectometer is described that is capable of measuring reflection coefficients as low as 0.001 and is particularly suitable for precise impedance matching. With the exception of a length of accurate plain waveguide, used as a standard, the instrument contains no critical co...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1969-04, Vol.17 (4), p.185-188
Main Authors: Hollway, D.L., Somlo, P.I.
Format: Article
Language:English
Subjects:
Detectors
Directional couplers
Displays
Frequency
Impedance measurement
Instruments
Interference
Oscilloscopes
Particle measurements
Reflection
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A simple swept-frequency reflectometer is described that is capable of measuring reflection coefficients as low as 0.001 and is particularly suitable for precise impedance matching. With the exception of a length of accurate plain waveguide, used as a standard, the instrument contains no critical components and requires no tuning adjustments. The reflection coefficient is displayed on an oscilloscope or X-Y recorder on an almost linear scale that is only slightly affected by departures from square-law detection.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.1969.1126930