Loading…
An efficient analysis of shielded single and multiple coupled microstrip lines with the nonuniform fast Fourier transform (NUFFT) technique
A nonuniform fast Fourier transform (NUFFT) technique is incorporated into the spectral-domain approach for the analysis of shielded single and multiple coupled microstrip lines. Each of the spectral-domain Green's functions is decomposed into an asymptotic part and a remaining part. At the int...
Saved in:
Published in: | IEEE transactions on microwave theory and techniques 2004-01, Vol.52 (1), p.90-96 |
---|---|
Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63 |
---|---|
cites | cdi_FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63 |
container_end_page | 96 |
container_issue | 1 |
container_start_page | 90 |
container_title | IEEE transactions on microwave theory and techniques |
container_volume | 52 |
creator | Su, K.-Y. Kuo, J.-T. |
description | A nonuniform fast Fourier transform (NUFFT) technique is incorporated into the spectral-domain approach for the analysis of shielded single and multiple coupled microstrip lines. Each of the spectral-domain Green's functions is decomposed into an asymptotic part and a remaining part. At the interface of layered dielectrics with conducting strips, the product of a basis function and an associated Green's function constitutes an expansion E-field. The inverse Fourier transform (IFT) of the expansion E-field is its spatial distribution all over the interface. We take this advantage to match the final boundary conditions on all the conducting strips simultaneously. As a result, if all the strips are at one interface, the number of operations required in this method is proportional to N/sub /spl lscr//, but not to N/sub /spl lscr///sup 2/, where N/sub /spl lscr// is the number of the strips. The IFT of the asymptotic part of each expansion E-field can be obtained analytically, and that of the remaining part can be quickly processed by the NUFFT. The Gauss-Chebyshev quadrature is used to accelerate the computations of the integrals resulted from the Galerkin's procedure. The proposed method is also applied to investigate the dispersion characteristics of coupled lines with finite metallization thickness and of coupled lines at different levels. A convergence analysis of the results is presented and a comparison of used CPU time is discussed. |
doi_str_mv | 10.1109/TMTT.2003.821248 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TMTT_2003_821248</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1262679</ieee_id><sourcerecordid>28423494</sourcerecordid><originalsourceid>FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63</originalsourceid><addsrcrecordid>eNqNksGO1DAMhiMEEsPCHYlLxAEthw52mrTJcbViAGmBS_ccdVqHyaqTDkkqtM_AS5MySEgcgJNl-_OfyP4Ze46wRQTzpvvYdVsBUG-1QCH1A7ZBpdrKNC08ZBsA1JWRGh6zJyndlVQq0Bv2_Spwcs4PnkLmfein--QTnx1PB0_TSCNPPnyZqPRGflym7E8lGealhFLwQ5xTjv7EJx8o8W8-H3g-EA9zWIJ3czxy16fMd_MSPUWeYx_Sz_Llp9vdrnvNMw2H4L8u9JQ9cv2U6NmveMFud2-76_fVzed3H66vbqpBqiZXSuxlKw0aMbq21saovSbRDBIdGGGMdFoBiRZJIhkCvce9w75spfTE2NQX7NVZ9xTn8mzK9ujTQNPUB5qXZIWR2BiQ_wa1hrpW7X-AUtTSrIqXfwWxaVEoUYtV8-Uf6F1ZYTlQslpLhPJLKBCcofUMKZKzp-iPfby3CHb1hV19YVdf2LMvysiL84gnot-4aETTmvoHSY2zqg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884102940</pqid></control><display><type>article</type><title>An efficient analysis of shielded single and multiple coupled microstrip lines with the nonuniform fast Fourier transform (NUFFT) technique</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Su, K.-Y. ; Kuo, J.-T.</creator><creatorcontrib>Su, K.-Y. ; Kuo, J.-T.</creatorcontrib><description>A nonuniform fast Fourier transform (NUFFT) technique is incorporated into the spectral-domain approach for the analysis of shielded single and multiple coupled microstrip lines. Each of the spectral-domain Green's functions is decomposed into an asymptotic part and a remaining part. At the interface of layered dielectrics with conducting strips, the product of a basis function and an associated Green's function constitutes an expansion E-field. The inverse Fourier transform (IFT) of the expansion E-field is its spatial distribution all over the interface. We take this advantage to match the final boundary conditions on all the conducting strips simultaneously. As a result, if all the strips are at one interface, the number of operations required in this method is proportional to N/sub /spl lscr//, but not to N/sub /spl lscr///sup 2/, where N/sub /spl lscr// is the number of the strips. The IFT of the asymptotic part of each expansion E-field can be obtained analytically, and that of the remaining part can be quickly processed by the NUFFT. The Gauss-Chebyshev quadrature is used to accelerate the computations of the integrals resulted from the Galerkin's procedure. The proposed method is also applied to investigate the dispersion characteristics of coupled lines with finite metallization thickness and of coupled lines at different levels. A convergence analysis of the results is presented and a comparison of used CPU time is discussed.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2003.821248</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acceleration ; Asymptotic properties ; Boundary conditions ; Conduction ; Dielectrics ; Fast Fourier transforms ; Fourier transforms ; Gaussian processes ; Green's function methods ; Green's functions ; Mathematical analysis ; Metallization ; Microstrip ; Microstrip lines ; Nonuniform ; Strip ; Strips ; Studies</subject><ispartof>IEEE transactions on microwave theory and techniques, 2004-01, Vol.52 (1), p.90-96</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2004</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63</citedby><cites>FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1262679$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,54771</link.rule.ids></links><search><creatorcontrib>Su, K.-Y.</creatorcontrib><creatorcontrib>Kuo, J.-T.</creatorcontrib><title>An efficient analysis of shielded single and multiple coupled microstrip lines with the nonuniform fast Fourier transform (NUFFT) technique</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>A nonuniform fast Fourier transform (NUFFT) technique is incorporated into the spectral-domain approach for the analysis of shielded single and multiple coupled microstrip lines. Each of the spectral-domain Green's functions is decomposed into an asymptotic part and a remaining part. At the interface of layered dielectrics with conducting strips, the product of a basis function and an associated Green's function constitutes an expansion E-field. The inverse Fourier transform (IFT) of the expansion E-field is its spatial distribution all over the interface. We take this advantage to match the final boundary conditions on all the conducting strips simultaneously. As a result, if all the strips are at one interface, the number of operations required in this method is proportional to N/sub /spl lscr//, but not to N/sub /spl lscr///sup 2/, where N/sub /spl lscr// is the number of the strips. The IFT of the asymptotic part of each expansion E-field can be obtained analytically, and that of the remaining part can be quickly processed by the NUFFT. The Gauss-Chebyshev quadrature is used to accelerate the computations of the integrals resulted from the Galerkin's procedure. The proposed method is also applied to investigate the dispersion characteristics of coupled lines with finite metallization thickness and of coupled lines at different levels. A convergence analysis of the results is presented and a comparison of used CPU time is discussed.</description><subject>Acceleration</subject><subject>Asymptotic properties</subject><subject>Boundary conditions</subject><subject>Conduction</subject><subject>Dielectrics</subject><subject>Fast Fourier transforms</subject><subject>Fourier transforms</subject><subject>Gaussian processes</subject><subject>Green's function methods</subject><subject>Green's functions</subject><subject>Mathematical analysis</subject><subject>Metallization</subject><subject>Microstrip</subject><subject>Microstrip lines</subject><subject>Nonuniform</subject><subject>Strip</subject><subject>Strips</subject><subject>Studies</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqNksGO1DAMhiMEEsPCHYlLxAEthw52mrTJcbViAGmBS_ccdVqHyaqTDkkqtM_AS5MySEgcgJNl-_OfyP4Ze46wRQTzpvvYdVsBUG-1QCH1A7ZBpdrKNC08ZBsA1JWRGh6zJyndlVQq0Bv2_Spwcs4PnkLmfein--QTnx1PB0_TSCNPPnyZqPRGflym7E8lGealhFLwQ5xTjv7EJx8o8W8-H3g-EA9zWIJ3czxy16fMd_MSPUWeYx_Sz_Llp9vdrnvNMw2H4L8u9JQ9cv2U6NmveMFud2-76_fVzed3H66vbqpBqiZXSuxlKw0aMbq21saovSbRDBIdGGGMdFoBiRZJIhkCvce9w75spfTE2NQX7NVZ9xTn8mzK9ujTQNPUB5qXZIWR2BiQ_wa1hrpW7X-AUtTSrIqXfwWxaVEoUYtV8-Uf6F1ZYTlQslpLhPJLKBCcofUMKZKzp-iPfby3CHb1hV19YVdf2LMvysiL84gnot-4aETTmvoHSY2zqg</recordid><startdate>200401</startdate><enddate>200401</enddate><creator>Su, K.-Y.</creator><creator>Kuo, J.-T.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>8BQ</scope><scope>JG9</scope><scope>7TB</scope></search><sort><creationdate>200401</creationdate><title>An efficient analysis of shielded single and multiple coupled microstrip lines with the nonuniform fast Fourier transform (NUFFT) technique</title><author>Su, K.-Y. ; Kuo, J.-T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Acceleration</topic><topic>Asymptotic properties</topic><topic>Boundary conditions</topic><topic>Conduction</topic><topic>Dielectrics</topic><topic>Fast Fourier transforms</topic><topic>Fourier transforms</topic><topic>Gaussian processes</topic><topic>Green's function methods</topic><topic>Green's functions</topic><topic>Mathematical analysis</topic><topic>Metallization</topic><topic>Microstrip</topic><topic>Microstrip lines</topic><topic>Nonuniform</topic><topic>Strip</topic><topic>Strips</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Su, K.-Y.</creatorcontrib><creatorcontrib>Kuo, J.-T.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>METADEX</collection><collection>Materials Research Database</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Su, K.-Y.</au><au>Kuo, J.-T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An efficient analysis of shielded single and multiple coupled microstrip lines with the nonuniform fast Fourier transform (NUFFT) technique</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2004-01</date><risdate>2004</risdate><volume>52</volume><issue>1</issue><spage>90</spage><epage>96</epage><pages>90-96</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>A nonuniform fast Fourier transform (NUFFT) technique is incorporated into the spectral-domain approach for the analysis of shielded single and multiple coupled microstrip lines. Each of the spectral-domain Green's functions is decomposed into an asymptotic part and a remaining part. At the interface of layered dielectrics with conducting strips, the product of a basis function and an associated Green's function constitutes an expansion E-field. The inverse Fourier transform (IFT) of the expansion E-field is its spatial distribution all over the interface. We take this advantage to match the final boundary conditions on all the conducting strips simultaneously. As a result, if all the strips are at one interface, the number of operations required in this method is proportional to N/sub /spl lscr//, but not to N/sub /spl lscr///sup 2/, where N/sub /spl lscr// is the number of the strips. The IFT of the asymptotic part of each expansion E-field can be obtained analytically, and that of the remaining part can be quickly processed by the NUFFT. The Gauss-Chebyshev quadrature is used to accelerate the computations of the integrals resulted from the Galerkin's procedure. The proposed method is also applied to investigate the dispersion characteristics of coupled lines with finite metallization thickness and of coupled lines at different levels. A convergence analysis of the results is presented and a comparison of used CPU time is discussed.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TMTT.2003.821248</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9480 |
ispartof | IEEE transactions on microwave theory and techniques, 2004-01, Vol.52 (1), p.90-96 |
issn | 0018-9480 1557-9670 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TMTT_2003_821248 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Acceleration Asymptotic properties Boundary conditions Conduction Dielectrics Fast Fourier transforms Fourier transforms Gaussian processes Green's function methods Green's functions Mathematical analysis Metallization Microstrip Microstrip lines Nonuniform Strip Strips Studies |
title | An efficient analysis of shielded single and multiple coupled microstrip lines with the nonuniform fast Fourier transform (NUFFT) technique |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T14%3A16%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=An%20efficient%20analysis%20of%20shielded%20single%20and%20multiple%20coupled%20microstrip%20lines%20with%20the%20nonuniform%20fast%20Fourier%20transform%20(NUFFT)%20technique&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Su,%20K.-Y.&rft.date=2004-01&rft.volume=52&rft.issue=1&rft.spage=90&rft.epage=96&rft.pages=90-96&rft.issn=0018-9480&rft.eissn=1557-9670&rft.coden=IETMAB&rft_id=info:doi/10.1109/TMTT.2003.821248&rft_dat=%3Cproquest_cross%3E28423494%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c456t-52b4749192df738995b8e26c41f092994f850e271e41e9e08b1bf1a2129942d63%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=884102940&rft_id=info:pmid/&rft_ieee_id=1262679&rfr_iscdi=true |