Effects of ionizing radiation on charge-coupled device structures

The effects of ionizing radiation on four different charge-coupled device structures have been investigated. Both shift registers and optical imaging devices have been considered. The electrical and imaging (where appropriate) performance of the devices were evaluated as a function of total gamma ra...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1974-12, Vol.21 (6), p.193-200
Main Authors: Killiany, J. M., Baker, W. D., Saks, N. S., Barbe, D. F.
Format: Article
Language:English
Subjects:
Charge coupled devices
Clocks
Electrodes
Fats
Interface states
Silicon
Voltage measurement
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Summary:The effects of ionizing radiation on four different charge-coupled device structures have been investigated. Both shift registers and optical imaging devices have been considered. The electrical and imaging (where appropriate) performance of the devices were evaluated as a function of total gamma ray dose. The principal failure mechanisms have been identified for each particular device structure. Some conclusions about the relative radiation tolerance of the various device designs are drawn.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.1974.6498927