Conduction Processes in Kapton H Irradiated by an Electron Beam

Current conduction in Kapton H films irradiated by a non-penetrating electron beam was studied by comparing the observed current-voltage characteristics with theoretical models. The functional dependence of the current on the electric field was found to be in relatively good agreement with the depen...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on nuclear science 1983-01, Vol.30 (6), p.4071-4076
Main Authors: Yadlowsky, Edward J., Hazelton, Robert C., Parker, Lee W.
Format: Article
Language:English
Subjects:
Conductive films
Conductivity
Current measurement
Current-voltage characteristics
Dielectric materials
Dielectric measurements
Electrodes
Electron beams
Insulation
Predictive models
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Current conduction in Kapton H films irradiated by a non-penetrating electron beam was studied by comparing the observed current-voltage characteristics with theoretical models. The functional dependence of the current on the electric field was found to be in relatively good agreement with the dependence predicted by the Poole-Frenkel conduction and Schottkey emission model. A beam energy dependence was observed that is not accounted for by these models. No correlation was obtained with space-charge-limited conduction model that assumes a zero electric field at the injecting electrode. This result was observed both for a field independent conductivity as well as for a Poole-Frenkel conductivity. A modified space-charge-limited conduction model that includes a finite electric field at the injection electrode appears to describe the observed dependence. This model incorporates any beam energy dependence in a natural way through a beam dependent variation in electric field that is predicted to occur at the boundary of the unirradiated region.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.1983.4333083