Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits

It is shown that the variety of shapes of the input current versus dose curve observed in several ICs is due to circuit effects, depending on the architecture, the value of the currents and the bias conditions. When stages are cascaded, the degradation of the second stage may add or subtract current...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on nuclear science 2008-12, Vol.55 (6), p.3174-3181
Main Authors: Dusseau, L., Bernard, M., Boch, J., Gonzalez Velo, Y., Roche, N., Lorfevre, E., Bezerra, F., Calvel, P., Marec, R., Saigne, F.
Format: Article
Language:English
Subjects:
Accumulators
Analog integrated circuits
Annealing
Bias
Bipolar integrated circuits
Bipolar transistors
circuit effects
Circuit testing
Collectors
Compensation
Current supplies
Degradation
dose rate
Electric circuits
Electronics
Engineering Sciences
Equations
integrated circuits (ICs)
Irradiation
Mathematical analysis
Shape
Temperature sensors
total dose
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:It is shown that the variety of shapes of the input current versus dose curve observed in several ICs is due to circuit effects, depending on the architecture, the value of the currents and the bias conditions. When stages are cascaded, the degradation of the second stage may add or subtract current to the collector current of the input transistor. The variations of the collector currents can be evaluated using the variations of the supply current. It is then possible to model the compensation effects using basic equations and study the impact of irradiation conditions. In some cases, the effect of biasing the circuit during irradiation is to reduce the compensation mechanism leading to an stronger increase in the input current. When a peak shaped degradation curve is recorded, annealing may either induce an additional degradation or a recovery depending on which side of the peak irradiation has brought the circuit.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2008.2006835