An Evaluation of An Ultralow Background Alpha-Particle Detector

XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2009-12, Vol.56 (6), p.3381-3386
Main Authors: Gordon, M.S., Heidel, D.F., Rodbell, K.P., Dwyer-McNally, B., Warburton, W.K.
Format: Article
Language:English
Subjects:
Alpha particles
Alpha rays
Alpha-particle detector
Counting circuits
Detectors
electronic signal rejection
Ionization
ionization counter
Lead
low background
Packaging
Pollution measurement
Prototypes
Semiconductor materials
Tin
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Description
Summary:XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2009.2034001