An Evaluation of An Ultralow Background Alpha-Particle Detector

XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.

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Published in:IEEE transactions on nuclear science 2009-12, Vol.56 (6), p.3381-3386
Main Authors: Gordon, M.S., Heidel, D.F., Rodbell, K.P., Dwyer-McNally, B., Warburton, W.K.
Format: Article
Language:English
Subjects:
Alpha particles
Alpha rays
Alpha-particle detector
Counting circuits
Detectors
electronic signal rejection
Ionization
ionization counter
Lead
low background
Packaging
Pollution measurement
Prototypes
Semiconductor materials
Tin
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cited_by cdi_FETCH-LOGICAL-c322t-b93cb46d8d880f34091fcfb72737a9939b6c60e1e267056ce784d0806b47e8d73
cites cdi_FETCH-LOGICAL-c322t-b93cb46d8d880f34091fcfb72737a9939b6c60e1e267056ce784d0806b47e8d73
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container_issue 6
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container_title IEEE transactions on nuclear science
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creator Gordon, M.S.
Heidel, D.F.
Rodbell, K.P.
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Warburton, W.K.
description XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.
doi_str_mv 10.1109/TNS.2009.2034001
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ispartof IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3381-3386
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source IEEE Electronic Library (IEL) Journals
subjects Alpha particles
Alpha rays
Alpha-particle detector
Counting circuits
Detectors
electronic signal rejection
Ionization
ionization counter
Lead
low background
Packaging
Pollution measurement
Prototypes
Semiconductor materials
Tin
title An Evaluation of An Ultralow Background Alpha-Particle Detector
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