Loading…
Single Phase Switching Tests on the AEP 765 KV System-Extinction Time for Large Secondary Arc Currents
Single Phase Switching (SPS) tests were performed on AEP's Kammer-Marysville 765 kV line during April of 1980 in order to determine the self-extinction times of large secondary arc currents in circuits with varying degrees of SPS compensation. Five fault tests were performed and the results are...
Saved in:
Published in: | IEEE transactions on power apparatus and systems 1983-08, Vol.PAS-102 (8), p.2775-2783 |
---|---|
Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13 |
---|---|
cites | cdi_FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13 |
container_end_page | 2783 |
container_issue | 8 |
container_start_page | 2775 |
container_title | IEEE transactions on power apparatus and systems |
container_volume | PAS-102 |
creator | Fakheri, A. J. Shuter, T. C. Schneider, J. M. Shih, C. H. |
description | Single Phase Switching (SPS) tests were performed on AEP's Kammer-Marysville 765 kV line during April of 1980 in order to determine the self-extinction times of large secondary arc currents in circuits with varying degrees of SPS compensation. Five fault tests were performed and the results are presented along with an analysis of various secondary arc parameters such as: volt-ampere characteristic, air gap dielectric recovery, harmonic spectrum and energy. An arc model was developed and verified in a computer simulation of one of the test circuits. |
doi_str_mv | 10.1109/TPAS.1983.317960 |
format | article |
fullrecord | <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TPAS_1983_317960</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4112277</ieee_id><sourcerecordid>10_1109_TPAS_1983_317960</sourcerecordid><originalsourceid>FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13</originalsourceid><addsrcrecordid>eNo9kF1LwzAYhYMoOD_uBW_yBzrz5m2T5rKM-YEDB63elpi93SJbK0lE9-_tmHh14HDO4fAwdgNiCiDMXbOs6imYEqcI2ihxwibSmCJTKPGUTYSAMjMFiHN2EeOHECgUwIR1te_XW-LLjY3E62-f3GZ0eEMxRT70PG2IV_Ml16rgz2-83sdEu2z-k3zvkh8Djd8R74bAFzasxwlyQ7-yYc-r4PjsKwTqU7xiZ53dRrr-00v2ej9vZo_Z4uXhaVYtMicVpEw506FGRC2xkJi7XGEhjJSdxVys4L10UipEWhFpBGUlSEOlKcscjHWAl0wcd10YYgzUtZ_B78Y3LYj2wKk9cGoPnNojp7Fye6x4IvqP5wBSao2_uk1h9Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Single Phase Switching Tests on the AEP 765 KV System-Extinction Time for Large Secondary Arc Currents</title><source>IEEE Xplore (Online service)</source><creator>Fakheri, A. J. ; Shuter, T. C. ; Schneider, J. M. ; Shih, C. H.</creator><creatorcontrib>Fakheri, A. J. ; Shuter, T. C. ; Schneider, J. M. ; Shih, C. H.</creatorcontrib><description>Single Phase Switching (SPS) tests were performed on AEP's Kammer-Marysville 765 kV line during April of 1980 in order to determine the self-extinction times of large secondary arc currents in circuits with varying degrees of SPS compensation. Five fault tests were performed and the results are presented along with an analysis of various secondary arc parameters such as: volt-ampere characteristic, air gap dielectric recovery, harmonic spectrum and energy. An arc model was developed and verified in a computer simulation of one of the test circuits.</description><identifier>ISSN: 0018-9510</identifier><identifier>EISSN: 2995-6323</identifier><identifier>DOI: 10.1109/TPAS.1983.317960</identifier><language>eng</language><publisher>IEEE</publisher><subject>Automatic testing ; Circuit faults ; Circuit testing ; Computer simulation ; Dielectrics ; Harmonic analysis ; Performance analysis ; Performance evaluation ; Switching circuits ; System testing</subject><ispartof>IEEE transactions on power apparatus and systems, 1983-08, Vol.PAS-102 (8), p.2775-2783</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13</citedby><cites>FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4112277$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Fakheri, A. J.</creatorcontrib><creatorcontrib>Shuter, T. C.</creatorcontrib><creatorcontrib>Schneider, J. M.</creatorcontrib><creatorcontrib>Shih, C. H.</creatorcontrib><title>Single Phase Switching Tests on the AEP 765 KV System-Extinction Time for Large Secondary Arc Currents</title><title>IEEE transactions on power apparatus and systems</title><addtitle>T-PAS</addtitle><description>Single Phase Switching (SPS) tests were performed on AEP's Kammer-Marysville 765 kV line during April of 1980 in order to determine the self-extinction times of large secondary arc currents in circuits with varying degrees of SPS compensation. Five fault tests were performed and the results are presented along with an analysis of various secondary arc parameters such as: volt-ampere characteristic, air gap dielectric recovery, harmonic spectrum and energy. An arc model was developed and verified in a computer simulation of one of the test circuits.</description><subject>Automatic testing</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Computer simulation</subject><subject>Dielectrics</subject><subject>Harmonic analysis</subject><subject>Performance analysis</subject><subject>Performance evaluation</subject><subject>Switching circuits</subject><subject>System testing</subject><issn>0018-9510</issn><issn>2995-6323</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNo9kF1LwzAYhYMoOD_uBW_yBzrz5m2T5rKM-YEDB63elpi93SJbK0lE9-_tmHh14HDO4fAwdgNiCiDMXbOs6imYEqcI2ihxwibSmCJTKPGUTYSAMjMFiHN2EeOHECgUwIR1te_XW-LLjY3E62-f3GZ0eEMxRT70PG2IV_Ml16rgz2-83sdEu2z-k3zvkh8Djd8R74bAFzasxwlyQ7-yYc-r4PjsKwTqU7xiZ53dRrr-00v2ej9vZo_Z4uXhaVYtMicVpEw506FGRC2xkJi7XGEhjJSdxVys4L10UipEWhFpBGUlSEOlKcscjHWAl0wcd10YYgzUtZ_B78Y3LYj2wKk9cGoPnNojp7Fye6x4IvqP5wBSao2_uk1h9Q</recordid><startdate>198308</startdate><enddate>198308</enddate><creator>Fakheri, A. J.</creator><creator>Shuter, T. C.</creator><creator>Schneider, J. M.</creator><creator>Shih, C. H.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198308</creationdate><title>Single Phase Switching Tests on the AEP 765 KV System-Extinction Time for Large Secondary Arc Currents</title><author>Fakheri, A. J. ; Shuter, T. C. ; Schneider, J. M. ; Shih, C. H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Automatic testing</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Computer simulation</topic><topic>Dielectrics</topic><topic>Harmonic analysis</topic><topic>Performance analysis</topic><topic>Performance evaluation</topic><topic>Switching circuits</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Fakheri, A. J.</creatorcontrib><creatorcontrib>Shuter, T. C.</creatorcontrib><creatorcontrib>Schneider, J. M.</creatorcontrib><creatorcontrib>Shih, C. H.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on power apparatus and systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fakheri, A. J.</au><au>Shuter, T. C.</au><au>Schneider, J. M.</au><au>Shih, C. H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Single Phase Switching Tests on the AEP 765 KV System-Extinction Time for Large Secondary Arc Currents</atitle><jtitle>IEEE transactions on power apparatus and systems</jtitle><stitle>T-PAS</stitle><date>1983-08</date><risdate>1983</risdate><volume>PAS-102</volume><issue>8</issue><spage>2775</spage><epage>2783</epage><pages>2775-2783</pages><issn>0018-9510</issn><eissn>2995-6323</eissn><abstract>Single Phase Switching (SPS) tests were performed on AEP's Kammer-Marysville 765 kV line during April of 1980 in order to determine the self-extinction times of large secondary arc currents in circuits with varying degrees of SPS compensation. Five fault tests were performed and the results are presented along with an analysis of various secondary arc parameters such as: volt-ampere characteristic, air gap dielectric recovery, harmonic spectrum and energy. An arc model was developed and verified in a computer simulation of one of the test circuits.</abstract><pub>IEEE</pub><doi>10.1109/TPAS.1983.317960</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9510 |
ispartof | IEEE transactions on power apparatus and systems, 1983-08, Vol.PAS-102 (8), p.2775-2783 |
issn | 0018-9510 2995-6323 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TPAS_1983_317960 |
source | IEEE Xplore (Online service) |
subjects | Automatic testing Circuit faults Circuit testing Computer simulation Dielectrics Harmonic analysis Performance analysis Performance evaluation Switching circuits System testing |
title | Single Phase Switching Tests on the AEP 765 KV System-Extinction Time for Large Secondary Arc Currents |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T22%3A02%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Single%20Phase%20Switching%20Tests%20on%20the%20AEP%20765%20KV%20System-Extinction%20Time%20for%20Large%20Secondary%20Arc%20Currents&rft.jtitle=IEEE%20transactions%20on%20power%20apparatus%20and%20systems&rft.au=Fakheri,%20A.%20J.&rft.date=1983-08&rft.volume=PAS-102&rft.issue=8&rft.spage=2775&rft.epage=2783&rft.pages=2775-2783&rft.issn=0018-9510&rft.eissn=2995-6323&rft_id=info:doi/10.1109/TPAS.1983.317960&rft_dat=%3Ccrossref_ieee_%3E10_1109_TPAS_1983_317960%3C/crossref_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c261t-6c9f373337235234c46350922fa340d1b8c22633edee7316a2129e8988419ac13%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4112277&rfr_iscdi=true |