The MICHELLE three-dimensional electron gun and collector modeling tool: theory and design

The development of a new three-dimensional electron gun and collector design tool is reported. This new simulation code has been designed to address the shortcomings of current beam optics simulation and modeling tools used for vacuum electron devices, ion sources, and charged-particle transport. Th...

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Bibliographic Details
Published in:IEEE transactions on plasma science 2002-06, Vol.30 (3), p.1238-1264
Main Authors: Petillo, J., Eppley, K., Panagos, D., Blanchard, P., Nelson, E., Dionne, N., DeFord, J., Held, B., Chernyakova, L., Krueger, W., Humphries, S., McClure, T., Mondelli, A., Burdette, J., Cattelino, M., True, R., Nguyen, K.T., Levush, B.
Format: Article
Language:English
Subjects:
Accumulators
Anisotropic magnetoresistance
Beams (radiation)
Collectors
Computer simulation
Design
Design engineering
Devices
Electron devices
Electron optics
Electrons
Geometrical optics
Guns
Instruments
Ion sources
Mathematical models
Optical beams
Optical design
Optical devices
Optics
Particle beam optics
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Summary:The development of a new three-dimensional electron gun and collector design tool is reported. This new simulation code has been designed to address the shortcomings of current beam optics simulation and modeling tools used for vacuum electron devices, ion sources, and charged-particle transport. The design tool specifically targets problem classes including gridded-guns, sheet-beam guns, multibeam devices, and anisotropic collectors, with a focus on improved physics models. The code includes both structured and unstructured grid systems for meshing flexibility. A new method for accurate particle tracking through the mesh is discussed. In the area of particle emission, new models for thermionic beam representation are included that support primary emission and secondary emission. Also discussed are new methods for temperature-limited and space-charge-limited (Child's law) emission, including the Longo-Vaughn formulation. A new secondary emission model is presented that captures true secondaries and the full range rediffused electrons. A description of the MICHELLE code is presented.
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.2002.801659