Piezoelectric ultrathin lead titanate films prepared by deposition of aquo-diol solutions

We report on the preparation of continuous ultrathin ferroelectric films of pure lead titanate by chemical solution deposition (CSD) methods. Aquo-diol solutions highly diluted have been used to obtain films with thickness down to 13 nm, the lowest reported for CSD films. The formation of islands in...

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Bibliographic Details
Published in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2006-12, Vol.53 (12), p.2299-2304
Main Authors: Ricote, J., Holgado, S., Ramos, P., Calzada, M.L.
Format: Article
Language:English
Subjects:
Capacitors
Chemicals
Coatings
Crystallization - methods
Deposition
Electric Impedance
Electromagnetic Fields
Electroplating - methods
Ferroelectric films
Ferroelectric materials
Lead - chemistry
Lead - radiation effects
Lead titanates
Materials Testing
Membranes, Artificial
Micromechanical devices
Nanocomposites
Nanoelectromechanical systems
Nanomaterials
Nanostructure
Nanostructures - chemistry
Nanostructures - radiation effects
Nanostructures - ultrastructure
Particle Size
Piezoelectric films
Piezoelectricity
Propylene Glycols - chemistry
Solutions
Temperature
Titanium - chemistry
Titanium - radiation effects
Titanium compounds
Water - chemistry
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Summary:We report on the preparation of continuous ultrathin ferroelectric films of pure lead titanate by chemical solution deposition (CSD) methods. Aquo-diol solutions highly diluted have been used to obtain films with thickness down to 13 nm, the lowest reported for CSD films. The formation of islands instead of continuous coatings, which has been reported when CSD is used to prepare ultrathin films, is avoided here. The piezoelectric activity of the films has been characterized by piezoresponse force microscopy, showing that the thinnest film obtained retains a significant piezoelectric activity at the nanoscale, which is promising for their use as transducer elements in nanoelectromechanical systems (NEMS)
ISSN:0885-3010
1525-8955
DOI:10.1109/TUFFC.2006.177