TA-B2 reliability of GaAlAs optical link light sources

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Bibliographic Details
Published in:IEEE transactions on electron devices 1979-11, Vol.26 (11), p.1835-1835
Main Authors: Zipfel, C.L., Keramidas, V.G., Saul, R.H.
Format: Article
Language:English
Subjects:
Implants
Laser beams
Measurement by laser beam
Mirrors
Molecular beam epitaxial growth
Semiconductor lasers
Temperature measurement
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ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1979.19721