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Numerical modeling of magnetic-field-sensitive semiconductor devices
Semiconductor devices in the presence of a magnetic field have been modeled numerically. The two-dimensional distributions of the electric potential, the electron concentration, and the hole concentration in a silicon slab exposed to a magnetic field have been computed. We have generalized the well-...
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Published in: | IEEE transactions on electron devices 1985-07, Vol.32 (7), p.1224-1230 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | Semiconductor devices in the presence of a magnetic field have been modeled numerically. The two-dimensional distributions of the electric potential, the electron concentration, and the hole concentration in a silicon slab exposed to a magnetic field have been computed. We have generalized the well-known Scharfetter-Gummel scheme to the case of two dimensions and nonzero magnetic field and employed a finite-difference technique. Our results are in support of earlier results in case of Hall plates. In intrinsic or closely intrinsic silicon, our results show both magnetoconcentration and space-charge effects. As a realistic example of a magnetic-field sensor, we have modeled a p + -i-n + silicon diode with split contacts. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/T-ED.1985.22105 |