Loading…
Plastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress
In an earlier work [1], thermal stresses in soldered pins were calculated under the assumption of an elastically deforming solder barrel. In the present analysis, the nonlinear,temperature dependent stress-strain curve of solder, without creep, is taken into account, yielding an elasto-plastic found...
Saved in:
Published in: | Journal of electronic packaging 1995-06, Vol.117 (2), p.136-140 |
---|---|
Main Authors: | , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33 |
---|---|
cites | cdi_FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33 |
container_end_page | 140 |
container_issue | 2 |
container_start_page | 136 |
container_title | Journal of electronic packaging |
container_volume | 117 |
creator | Engel, Peter A. Chou, Shou-Chien |
description | In an earlier work [1], thermal stresses in soldered pins were calculated under the assumption of an elastically deforming solder barrel. In the present analysis, the nonlinear,temperature dependent stress-strain curve of solder, without creep, is taken into account, yielding an elasto-plastic foundation modulus function. For the thermal mismatch loading, the total temperature range ΔT (e.g., 0–100°C) is divided into a finite number n of temperature stages, and the final responses are superposed from the n contributions each of which done using an isothermal stress calculation. Three solders (Sn-Pb solders 63/37, 70/30, and 10/90), were investigated; the solder barrel thickness and mismatch temperature range were also variable parameters. Comparisons with elastic solder foundation calculation results show that thermal and inelastic solder stress/strain dependence should be included especially in the higher (over 75°C) temperature range. |
doi_str_mv | 10.1115/1.2792080 |
format | article |
fullrecord | <record><control><sourceid>asme_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1115_1_2792080</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>404101</sourcerecordid><originalsourceid>FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33</originalsourceid><addsrcrecordid>eNotkDFPwzAUhC0EEqUwMLN4ZUixYydxxqpAAVWiUspsvdjPIlEaI9sd-u9J1Q6nu-Hu6ekj5JGzBee8eOGLvKpzptgVmfEiV1nNpLyeMpMiq0StbsldjD1jXAhZzkizHSCmztBXdD7sIXV-pN7Rxg8WA_3y3Zgi7Ua6nbQOnaXLEOAYaXNoezQJLU2e7n5x2g60SQFjvCc3DoaIDxefk5_3t93qI9t8rz9Xy00GuaxSJgoFQloEFDkXLRhwyllpHBiGaGrAlud1UUpVV0qUwpZVxUxpDZNOFq0Qc_J8vmuCjzGg03-h20M4as70iYbm-kJj6j6duxD3qHt_COP0mpZM8gnFP8PIWt0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Plastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress</title><source>ASME Transactions Journals (Archives)</source><creator>Engel, Peter A. ; Chou, Shou-Chien</creator><creatorcontrib>Engel, Peter A. ; Chou, Shou-Chien</creatorcontrib><description>In an earlier work [1], thermal stresses in soldered pins were calculated under the assumption of an elastically deforming solder barrel. In the present analysis, the nonlinear,temperature dependent stress-strain curve of solder, without creep, is taken into account, yielding an elasto-plastic foundation modulus function. For the thermal mismatch loading, the total temperature range ΔT (e.g., 0–100°C) is divided into a finite number n of temperature stages, and the final responses are superposed from the n contributions each of which done using an isothermal stress calculation. Three solders (Sn-Pb solders 63/37, 70/30, and 10/90), were investigated; the solder barrel thickness and mismatch temperature range were also variable parameters. Comparisons with elastic solder foundation calculation results show that thermal and inelastic solder stress/strain dependence should be included especially in the higher (over 75°C) temperature range.</description><identifier>ISSN: 1043-7398</identifier><identifier>EISSN: 1528-9044</identifier><identifier>DOI: 10.1115/1.2792080</identifier><language>eng</language><publisher>ASME</publisher><ispartof>Journal of electronic packaging, 1995-06, Vol.117 (2), p.136-140</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33</citedby><cites>FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902,38496</link.rule.ids></links><search><creatorcontrib>Engel, Peter A.</creatorcontrib><creatorcontrib>Chou, Shou-Chien</creatorcontrib><title>Plastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress</title><title>Journal of electronic packaging</title><addtitle>J. Electron. Packag</addtitle><description>In an earlier work [1], thermal stresses in soldered pins were calculated under the assumption of an elastically deforming solder barrel. In the present analysis, the nonlinear,temperature dependent stress-strain curve of solder, without creep, is taken into account, yielding an elasto-plastic foundation modulus function. For the thermal mismatch loading, the total temperature range ΔT (e.g., 0–100°C) is divided into a finite number n of temperature stages, and the final responses are superposed from the n contributions each of which done using an isothermal stress calculation. Three solders (Sn-Pb solders 63/37, 70/30, and 10/90), were investigated; the solder barrel thickness and mismatch temperature range were also variable parameters. Comparisons with elastic solder foundation calculation results show that thermal and inelastic solder stress/strain dependence should be included especially in the higher (over 75°C) temperature range.</description><issn>1043-7398</issn><issn>1528-9044</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><recordid>eNotkDFPwzAUhC0EEqUwMLN4ZUixYydxxqpAAVWiUspsvdjPIlEaI9sd-u9J1Q6nu-Hu6ekj5JGzBee8eOGLvKpzptgVmfEiV1nNpLyeMpMiq0StbsldjD1jXAhZzkizHSCmztBXdD7sIXV-pN7Rxg8WA_3y3Zgi7Ua6nbQOnaXLEOAYaXNoezQJLU2e7n5x2g60SQFjvCc3DoaIDxefk5_3t93qI9t8rz9Xy00GuaxSJgoFQloEFDkXLRhwyllpHBiGaGrAlud1UUpVV0qUwpZVxUxpDZNOFq0Qc_J8vmuCjzGg03-h20M4as70iYbm-kJj6j6duxD3qHt_COP0mpZM8gnFP8PIWt0</recordid><startdate>19950601</startdate><enddate>19950601</enddate><creator>Engel, Peter A.</creator><creator>Chou, Shou-Chien</creator><general>ASME</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19950601</creationdate><title>Plastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress</title><author>Engel, Peter A. ; Chou, Shou-Chien</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Engel, Peter A.</creatorcontrib><creatorcontrib>Chou, Shou-Chien</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of electronic packaging</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Engel, Peter A.</au><au>Chou, Shou-Chien</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Plastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress</atitle><jtitle>Journal of electronic packaging</jtitle><stitle>J. Electron. Packag</stitle><date>1995-06-01</date><risdate>1995</risdate><volume>117</volume><issue>2</issue><spage>136</spage><epage>140</epage><pages>136-140</pages><issn>1043-7398</issn><eissn>1528-9044</eissn><abstract>In an earlier work [1], thermal stresses in soldered pins were calculated under the assumption of an elastically deforming solder barrel. In the present analysis, the nonlinear,temperature dependent stress-strain curve of solder, without creep, is taken into account, yielding an elasto-plastic foundation modulus function. For the thermal mismatch loading, the total temperature range ΔT (e.g., 0–100°C) is divided into a finite number n of temperature stages, and the final responses are superposed from the n contributions each of which done using an isothermal stress calculation. Three solders (Sn-Pb solders 63/37, 70/30, and 10/90), were investigated; the solder barrel thickness and mismatch temperature range were also variable parameters. Comparisons with elastic solder foundation calculation results show that thermal and inelastic solder stress/strain dependence should be included especially in the higher (over 75°C) temperature range.</abstract><pub>ASME</pub><doi>10.1115/1.2792080</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1043-7398 |
ispartof | Journal of electronic packaging, 1995-06, Vol.117 (2), p.136-140 |
issn | 1043-7398 1528-9044 |
language | eng |
recordid | cdi_crossref_primary_10_1115_1_2792080 |
source | ASME Transactions Journals (Archives) |
title | Plastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T23%3A31%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-asme_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Plastic%20Deformation%20of%20Solder%20Joints%20in%20Pin%20Grid%20Arrays%20Subjected%20to%20Thermal%20Stress&rft.jtitle=Journal%20of%20electronic%20packaging&rft.au=Engel,%20Peter%20A.&rft.date=1995-06-01&rft.volume=117&rft.issue=2&rft.spage=136&rft.epage=140&rft.pages=136-140&rft.issn=1043-7398&rft.eissn=1528-9044&rft_id=info:doi/10.1115/1.2792080&rft_dat=%3Casme_cross%3E404101%3C/asme_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-a247t-358a34deae3213bacaf8fd4cfac0eec9aeb1295648978363d6770c6dc04f45b33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |