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Analytical study on small contact hole process for sub-65nm node generation
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Published in: | Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena Microelectronics and nanometer structures processing, measurement and phenomena, 2004-11, Vol.22 (6), p.L38-L43 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
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cited_by | cdi_FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623 |
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cites | cdi_FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623 |
container_end_page | L43 |
container_issue | 6 |
container_start_page | L38 |
container_title | Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena |
container_volume | 22 |
creator | Kim, Hyun-Woo Yoon, Jin-Young Hah, Jung-Hwan Woo, Sang-Gyun Cho, Han-Ku Moon, Joo-Tae |
description | |
doi_str_mv | 10.1116/1.1815315 |
format | article |
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ispartof | Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2004-11, Vol.22 (6), p.L38-L43 |
issn | 1071-1023 1520-8567 |
language | eng |
recordid | cdi_crossref_primary_10_1116_1_1815315 |
source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
title | Analytical study on small contact hole process for sub-65nm node generation |
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