Loading…

Analytical study on small contact hole process for sub-65nm node generation

Saved in:
Bibliographic Details
Published in:Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena Microelectronics and nanometer structures processing, measurement and phenomena, 2004-11, Vol.22 (6), p.L38-L43
Main Authors: Kim, Hyun-Woo, Yoon, Jin-Young, Hah, Jung-Hwan, Woo, Sang-Gyun, Cho, Han-Ku, Moon, Joo-Tae
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623
cites cdi_FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623
container_end_page L43
container_issue 6
container_start_page L38
container_title Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
container_volume 22
creator Kim, Hyun-Woo
Yoon, Jin-Young
Hah, Jung-Hwan
Woo, Sang-Gyun
Cho, Han-Ku
Moon, Joo-Tae
description
doi_str_mv 10.1116/1.1815315
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1116_1_1815315</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1116_1_1815315</sourcerecordid><originalsourceid>FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623</originalsourceid><addsrcrecordid>eNotkDtPwzAURi0EEqUw8A-8Mrj4OvF1GKuKl6jE0j268QOCXLuy0yH_niI6nU9n-IbD2D3IFQDgI6ygA92AvmAL0EqKTqO5PG1pQIBUzTW7qfVHSom6aRbsY50oztNoKfI6Hd3Mc-J1TzFym9NEduLfOXp-KNn6WnnIhdfjIFCnPU_Zef7lky80jTndsqtAsfq7M5ds9_K827yJ7efr-2a9Fda0WvgnbdvBI4ZuCMY6RFSGnFMqSGeskjRo4zoCMp1HIuPagB0qfzK6RdUs2cP_rS251uJDfyjjnsrcg-z_IvTQnyM0v6NfTwI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Analytical study on small contact hole process for sub-65nm node generation</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Kim, Hyun-Woo ; Yoon, Jin-Young ; Hah, Jung-Hwan ; Woo, Sang-Gyun ; Cho, Han-Ku ; Moon, Joo-Tae</creator><creatorcontrib>Kim, Hyun-Woo ; Yoon, Jin-Young ; Hah, Jung-Hwan ; Woo, Sang-Gyun ; Cho, Han-Ku ; Moon, Joo-Tae</creatorcontrib><identifier>ISSN: 1071-1023</identifier><identifier>EISSN: 1520-8567</identifier><identifier>DOI: 10.1116/1.1815315</identifier><language>eng</language><ispartof>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2004-11, Vol.22 (6), p.L38-L43</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623</citedby><cites>FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kim, Hyun-Woo</creatorcontrib><creatorcontrib>Yoon, Jin-Young</creatorcontrib><creatorcontrib>Hah, Jung-Hwan</creatorcontrib><creatorcontrib>Woo, Sang-Gyun</creatorcontrib><creatorcontrib>Cho, Han-Ku</creatorcontrib><creatorcontrib>Moon, Joo-Tae</creatorcontrib><title>Analytical study on small contact hole process for sub-65nm node generation</title><title>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena</title><issn>1071-1023</issn><issn>1520-8567</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNotkDtPwzAURi0EEqUw8A-8Mrj4OvF1GKuKl6jE0j268QOCXLuy0yH_niI6nU9n-IbD2D3IFQDgI6ygA92AvmAL0EqKTqO5PG1pQIBUzTW7qfVHSom6aRbsY50oztNoKfI6Hd3Mc-J1TzFym9NEduLfOXp-KNn6WnnIhdfjIFCnPU_Zef7lky80jTndsqtAsfq7M5ds9_K827yJ7efr-2a9Fda0WvgnbdvBI4ZuCMY6RFSGnFMqSGeskjRo4zoCMp1HIuPagB0qfzK6RdUs2cP_rS251uJDfyjjnsrcg-z_IvTQnyM0v6NfTwI</recordid><startdate>20041101</startdate><enddate>20041101</enddate><creator>Kim, Hyun-Woo</creator><creator>Yoon, Jin-Young</creator><creator>Hah, Jung-Hwan</creator><creator>Woo, Sang-Gyun</creator><creator>Cho, Han-Ku</creator><creator>Moon, Joo-Tae</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20041101</creationdate><title>Analytical study on small contact hole process for sub-65nm node generation</title><author>Kim, Hyun-Woo ; Yoon, Jin-Young ; Hah, Jung-Hwan ; Woo, Sang-Gyun ; Cho, Han-Ku ; Moon, Joo-Tae</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Kim, Hyun-Woo</creatorcontrib><creatorcontrib>Yoon, Jin-Young</creatorcontrib><creatorcontrib>Hah, Jung-Hwan</creatorcontrib><creatorcontrib>Woo, Sang-Gyun</creatorcontrib><creatorcontrib>Cho, Han-Ku</creatorcontrib><creatorcontrib>Moon, Joo-Tae</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Hyun-Woo</au><au>Yoon, Jin-Young</au><au>Hah, Jung-Hwan</au><au>Woo, Sang-Gyun</au><au>Cho, Han-Ku</au><au>Moon, Joo-Tae</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analytical study on small contact hole process for sub-65nm node generation</atitle><jtitle>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena</jtitle><date>2004-11-01</date><risdate>2004</risdate><volume>22</volume><issue>6</issue><spage>L38</spage><epage>L43</epage><pages>L38-L43</pages><issn>1071-1023</issn><eissn>1520-8567</eissn><doi>10.1116/1.1815315</doi></addata></record>
fulltext fulltext
identifier ISSN: 1071-1023
ispartof Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2004-11, Vol.22 (6), p.L38-L43
issn 1071-1023
1520-8567
language eng
recordid cdi_crossref_primary_10_1116_1_1815315
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
title Analytical study on small contact hole process for sub-65nm node generation
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T20%3A56%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analytical%20study%20on%20small%20contact%20hole%20process%20for%20sub-65nm%20node%20generation&rft.jtitle=Journal%20of%20vacuum%20science%20&%20technology.%20B,%20Microelectronics%20and%20nanometer%20structures%20processing,%20measurement%20and%20phenomena&rft.au=Kim,%20Hyun-Woo&rft.date=2004-11-01&rft.volume=22&rft.issue=6&rft.spage=L38&rft.epage=L43&rft.pages=L38-L43&rft.issn=1071-1023&rft.eissn=1520-8567&rft_id=info:doi/10.1116/1.1815315&rft_dat=%3Ccrossref%3E10_1116_1_1815315%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c745-e95c4be66f8bf7cd66627add22f0d7c20ab57d8a1a78e6aa7d4f6862ea1a54623%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true