As-rich InAs(001)-(2×4) phases investigated by in situ surface x-ray diffraction

Surface x-ray diffraction has been employed, in situ, to measure InAs(001)-(2×4) surface phases under technologically relevant growth conditions. For the As-rich (2×4) phase, the authors obtain good agreement between the data and the β2(2×4) surface reconstruction model. Comparison of our measuremen...

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Published in:Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena Microelectronics and nanometer structures processing, measurement and phenomena, 2008-07, Vol.26 (4), p.1516-1520
Main Authors: Tinkham, B. P., Braun, W., Ploog, K. H., Takahasi, M., Mizuki, J., Grosse, F.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733
cites cdi_FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733
container_end_page 1520
container_issue 4
container_start_page 1516
container_title Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
container_volume 26
creator Tinkham, B. P.
Braun, W.
Ploog, K. H.
Takahasi, M.
Mizuki, J.
Grosse, F.
description Surface x-ray diffraction has been employed, in situ, to measure InAs(001)-(2×4) surface phases under technologically relevant growth conditions. For the As-rich (2×4) phase, the authors obtain good agreement between the data and the β2(2×4) surface reconstruction model. Comparison of our measurements on the (2×4) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of α2(2×4) and β2(2×4) surface structures present on the surface.
doi_str_mv 10.1116/1.2918314
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1116_1_2918314</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1116_1_2918314</sourcerecordid><originalsourceid>FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733</originalsourceid><addsrcrecordid>eNotkL1OwzAURi0EEqUw8AYem8HF175xnDGq-KlUCSHBHDmOTY0grXxTRJ-EB-LFKKLT-c7yDYexa5BzADA3MFc1WA14wiZQKilsaarTw5YVCJBKn7MLojcppSm1nrCnhkROfs2XQ0MzKaEQM_XzjQXfrh0F4mn4DDSmVzeGnnf7g3NK447TLkfnA_8S2e15n2LMzo9pM1yys-jeKVwdOWUvd7fPiwexerxfLpqV8ErVo0Bb26glehXQVn2JzmCPqBBBR9C1rVQXsexisEbL3oYuOmdUhCoG7yqtp6z4__V5Q5RDbLc5fbi8b0G2fy1aaI8t9C99ZU9Y</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>As-rich InAs(001)-(2×4) phases investigated by in situ surface x-ray diffraction</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Tinkham, B. P. ; Braun, W. ; Ploog, K. H. ; Takahasi, M. ; Mizuki, J. ; Grosse, F.</creator><creatorcontrib>Tinkham, B. P. ; Braun, W. ; Ploog, K. H. ; Takahasi, M. ; Mizuki, J. ; Grosse, F.</creatorcontrib><description>Surface x-ray diffraction has been employed, in situ, to measure InAs(001)-(2×4) surface phases under technologically relevant growth conditions. For the As-rich (2×4) phase, the authors obtain good agreement between the data and the β2(2×4) surface reconstruction model. Comparison of our measurements on the (2×4) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of α2(2×4) and β2(2×4) surface structures present on the surface.</description><identifier>ISSN: 1071-1023</identifier><identifier>EISSN: 1520-8567</identifier><identifier>DOI: 10.1116/1.2918314</identifier><language>eng</language><ispartof>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2008-07, Vol.26 (4), p.1516-1520</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733</citedby><cites>FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Tinkham, B. P.</creatorcontrib><creatorcontrib>Braun, W.</creatorcontrib><creatorcontrib>Ploog, K. H.</creatorcontrib><creatorcontrib>Takahasi, M.</creatorcontrib><creatorcontrib>Mizuki, J.</creatorcontrib><creatorcontrib>Grosse, F.</creatorcontrib><title>As-rich InAs(001)-(2×4) phases investigated by in situ surface x-ray diffraction</title><title>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena</title><description>Surface x-ray diffraction has been employed, in situ, to measure InAs(001)-(2×4) surface phases under technologically relevant growth conditions. For the As-rich (2×4) phase, the authors obtain good agreement between the data and the β2(2×4) surface reconstruction model. Comparison of our measurements on the (2×4) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of α2(2×4) and β2(2×4) surface structures present on the surface.</description><issn>1071-1023</issn><issn>1520-8567</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNotkL1OwzAURi0EEqUw8AYem8HF175xnDGq-KlUCSHBHDmOTY0grXxTRJ-EB-LFKKLT-c7yDYexa5BzADA3MFc1WA14wiZQKilsaarTw5YVCJBKn7MLojcppSm1nrCnhkROfs2XQ0MzKaEQM_XzjQXfrh0F4mn4DDSmVzeGnnf7g3NK447TLkfnA_8S2e15n2LMzo9pM1yys-jeKVwdOWUvd7fPiwexerxfLpqV8ErVo0Bb26glehXQVn2JzmCPqBBBR9C1rVQXsexisEbL3oYuOmdUhCoG7yqtp6z4__V5Q5RDbLc5fbi8b0G2fy1aaI8t9C99ZU9Y</recordid><startdate>20080701</startdate><enddate>20080701</enddate><creator>Tinkham, B. P.</creator><creator>Braun, W.</creator><creator>Ploog, K. H.</creator><creator>Takahasi, M.</creator><creator>Mizuki, J.</creator><creator>Grosse, F.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20080701</creationdate><title>As-rich InAs(001)-(2×4) phases investigated by in situ surface x-ray diffraction</title><author>Tinkham, B. P. ; Braun, W. ; Ploog, K. H. ; Takahasi, M. ; Mizuki, J. ; Grosse, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tinkham, B. P.</creatorcontrib><creatorcontrib>Braun, W.</creatorcontrib><creatorcontrib>Ploog, K. H.</creatorcontrib><creatorcontrib>Takahasi, M.</creatorcontrib><creatorcontrib>Mizuki, J.</creatorcontrib><creatorcontrib>Grosse, F.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tinkham, B. P.</au><au>Braun, W.</au><au>Ploog, K. H.</au><au>Takahasi, M.</au><au>Mizuki, J.</au><au>Grosse, F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>As-rich InAs(001)-(2×4) phases investigated by in situ surface x-ray diffraction</atitle><jtitle>Journal of vacuum science &amp; technology. B, Microelectronics and nanometer structures processing, measurement and phenomena</jtitle><date>2008-07-01</date><risdate>2008</risdate><volume>26</volume><issue>4</issue><spage>1516</spage><epage>1520</epage><pages>1516-1520</pages><issn>1071-1023</issn><eissn>1520-8567</eissn><abstract>Surface x-ray diffraction has been employed, in situ, to measure InAs(001)-(2×4) surface phases under technologically relevant growth conditions. For the As-rich (2×4) phase, the authors obtain good agreement between the data and the β2(2×4) surface reconstruction model. Comparison of our measurements on the (2×4) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of α2(2×4) and β2(2×4) surface structures present on the surface.</abstract><doi>10.1116/1.2918314</doi><tpages>5</tpages></addata></record>
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ispartof Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2008-07, Vol.26 (4), p.1516-1520
issn 1071-1023
1520-8567
language eng
recordid cdi_crossref_primary_10_1116_1_2918314
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title As-rich InAs(001)-(2×4) phases investigated by in situ surface x-ray diffraction
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T01%3A11%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=As-rich%20InAs(001)-(2%C3%974)%20phases%20investigated%20by%20in%20situ%20surface%20x-ray%20diffraction&rft.jtitle=Journal%20of%20vacuum%20science%20&%20technology.%20B,%20Microelectronics%20and%20nanometer%20structures%20processing,%20measurement%20and%20phenomena&rft.au=Tinkham,%20B.%20P.&rft.date=2008-07-01&rft.volume=26&rft.issue=4&rft.spage=1516&rft.epage=1520&rft.pages=1516-1520&rft.issn=1071-1023&rft.eissn=1520-8567&rft_id=info:doi/10.1116/1.2918314&rft_dat=%3Ccrossref%3E10_1116_1_2918314%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c229t-4898f304c2e487d54a64d4424413f139872bf45bfe8630d8ebfaa62f17feca733%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true