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Enhanced structural and optical properties of semipolar ( 11 2 ¯ 2) AlGaN film with insertion of AlN/AlGaN superlattice
The high-quality semipolar ( 11 2 ¯ 2) AlGaN films with high Al contents were successfully deposited on ( 10 1 ¯ 0) m-plane sapphire substrates with the insertion of AlN/AlGaN superlattice (SL) by metal-organic chemical vapor deposition technology. The dependence of structural and optical properties...
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Published in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2023-09, Vol.41 (5) |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | The high-quality semipolar (
11
2
¯
2) AlGaN films with high Al contents were successfully deposited on (
10
1
¯
0) m-plane sapphire substrates with the insertion of AlN/AlGaN superlattice (SL) by metal-organic chemical vapor deposition technology. The dependence of structural and optical properties of the (
11
2
¯
2) AlGaN film on the deposition parameters for the inserted AlN/AlGaN SL was investigated extensively premised on the characterization results of the optical microscope, atomic force microscopy, relative optical transmittance spectroscopy, high-resolution x-ray diffraction, and photoluminescence spectroscopy. It was discovered that the insertion of the AlN/AlGaN SL grown under an optimized stabilization time of 10 s between the deposition of AlN and AlGaN sublayers could be used to make significant enhancements in surface morphological characteristics, crystal quality, and optical properties of the (
11
2
¯
2) AlGaN film. The mechanism for the defects reduction in the (
11
2
¯
2) AlGaN film was revealed to be owing to the increase in bending and annihilating probability of the threading dislocations, basal-plane stacking faults, and other structural defects promoted by introducing sufficiently high desorbed Ga atom-induced vacancy concentration in the optimized thermal treatment process. |
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ISSN: | 0734-2101 1520-8559 |
DOI: | 10.1116/6.0002870 |