Method of characterization of effective shrinkage in reflection holograms

A method is described to evaluate plane-wave volume hologram fringe inclination and spacing, as well as the recording material average refraction index. This evaluation allows us to estimate changes in the hologram parameters due to recording material shrinkage. The method is based on measurements o...

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Bibliographic Details
Published in:Optical Engineering 2004-05, Vol.43 (5), p.1160-1168
Main Authors: Trochtchanovitch, Pavel, Kostrov, Nikolai, Goulanian, Emine, Zerrouk, A. Faouzi, Pen, Evgeny, Shelkovnikov, Vladimir
Format: Article
Language:English
Subjects:
measurement of hologram shrinkage and refractive index
photopolymers
volume holograms
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Summary:A method is described to evaluate plane-wave volume hologram fringe inclination and spacing, as well as the recording material average refraction index. This evaluation allows us to estimate changes in the hologram parameters due to recording material shrinkage. The method is based on measurements of the incident and diffracted beam Bragg angles for two different wavelengths. The conditions for minimizing measurement errors are obtained. The experimental data are in good agreement with the calculated data. ©
ISSN:0091-3286
1560-2303
DOI:10.1117/1.1666743