Ghosting caused by bulk charge trapping in direct conversion flat-panel detectors using amorphous selenium: Ghosting in amorphous selenium flat-panel detectors

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Bibliographic Details
Published in:Medical physics (Lancaster) 2005-01, Vol.32 (2), p.488-500
Main Authors: Zhao, Wei, DeCrescenzo, G., Kasap, Safa O., Rowlands, J. A.
Format: Article
Language:English
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ISSN:0094-2405
DOI:10.1118/1.1843353