Effect of radiation on the characteristics of MIS structures containing rare-earth oxides

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 1997-07, Vol.31 (7), p.752-755
Main Authors: Fedorenko, Ya. G., Otavina, L. A., Ledeneva, E. V., Sverdlova, A. M.
Format: Article
Language:English
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ISSN:1063-7826
1090-6479
DOI:10.1134/1.1187085