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On the temperature and field dependences of the effective surface mobility in MIS structures

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 1998-06, Vol.32 (6), p.673-676
Main Authors: Gergel’, V. A., Timofeev, M. V., Zelenyi, A. P.
Format: Article
Language:English
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ISSN:1063-7826
1090-6479
DOI:10.1134/1.1187463