Structural and noise characterization of VO2 films on SiO2/Si substrates

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Bibliographic Details
Published in:Technical physics letters 1997-07, Vol.23 (7), p.520-522
Main Authors: Baidakova, M. V., Bobyl’, A. V., Malyarov, V. G., Tret’yakov, V. V., Khrebtov, I. A., Shaganov, I. I.
Format: Article
Language:English
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ISSN:1063-7850
1090-6533
DOI:10.1134/1.1261815