Temperature dependence of a magnetoresistance effect in the films of ferromagnetic semiconductors based on oxides of rare-earth elements

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2001-03, Vol.35 (3), p.295-297
Main Authors: Kabanov, V. F., Karasev, S. A., Fedorenko, Ya. G.
Format: Article
Language:English
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ISSN:1063-7826
1090-6479
DOI:10.1134/1.1356150